Title:
PROBE PIN, TEST JIG, TEST UNIT, AND TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/138504
Kind Code:
A1
Abstract:
A probe pin according to the present invention is provided with an elastic section (11), a first contact section (12), and a second contact section (13). The elastic section includes a plurality of strip-shaped elastic pieces (21-24), and each of the strip-shaped elastic pieces includes: a first linear section having one end section (111) in the extending direction thereof connected to the first contact section from a direction crossing the lengthwise direction of the probe pin; a second linear section having one end section (112) in the extending direction thereof connected to the second contact section from a direction crossing the lengthwise direction of the probe pin; and a curved section connected to the other end section of the first linear section and the other end section of the second linear section.
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Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI HUN (KR)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI HUN (KR)
Application Number:
PCT/JP2018/000505
Publication Date:
July 18, 2019
Filing Date:
January 11, 2018
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067
Domestic Patent References:
| WO2015079825A1 | 2015-06-04 |
Foreign References:
| JPS60113991U | 1985-08-01 | |||
| JP2017223629A | 2017-12-21 | |||
| JP4883215B1 | 2012-02-22 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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