PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE

Title:

PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE

Document Type and Number:

WIPO Patent Application WO/2002/025265

Kind Code:

A1

Abstract:

A probing device based on mass spectrometry, wherein a fast screening is conducted by using a step (201) of acquiring mass spectrum and a step (202) of judging whether or not an intrinsic m/z ion exists. Switching is made, for scrutinizing, to a step (203) of conducting a tandem mass spectrometry depending on the judged result in the judging step (202). A warning is triggered (205) from the result obtained in the tandem mass spectrometry via a step (204) of judging whether or not an intrinsic m/z ion exists and according to the judgment result. Whereby, a fast and substantially error-free probing is made possible.

Inventors:

TAKADA YASUAKI (JP)
SAKAIRI MINORU (JP)

Application Number:

PCT/JP2000/006411

Publication Date:

March 28, 2002

Filing Date:

September 20, 2000

Export Citation:

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Assignee:

HITACHI LTD (JP)
TAKADA YASUAKI (JP)
SAKAIRI MINORU (JP)

International Classes:

B01D59/44; H01J49/42; (IPC1-7): G01N27/62; H01J49/42

Foreign References:

JP2000028579A	2000-01-28
JPS57148866A	1982-09-14
JPH11230918A	1999-08-27

Other References: