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Patent Searching and Data


Title:
PROCESSING PREDICTION SYSTEM AND PROCESSING PREDICTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/219355
Kind Code:
A1
Abstract:
Disclosed is a processing prediction system comprising: a determination map unit in which a defect region where a material is damaged when the material is processed and a non-defect region where the material is not damaged when the material is processed are prestored; and a determination unit which determines whether, if an external force is applied to the material, the material is located in the defect region or the non-defect region.

Inventors:
KIM NAK SOO (KR)
PARK JOON HEE (KR)
Application Number:
PCT/KR2023/006202
Publication Date:
November 16, 2023
Filing Date:
May 08, 2023
Export Citation:
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Assignee:
UNIV SOGANG RES & BUSINESS DEVELOPMENT FOUND (KR)
SBB TECH CO LTD (KR)
International Classes:
G01N3/18
Foreign References:
KR20160129388A2016-11-09
JP2011140046A2011-07-21
JP2005351661A2005-12-22
KR20100030818A2010-03-19
JP2006523351A2006-10-12
Attorney, Agent or Firm:
IPCJ PATENT & LAW FIRM (KR)
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