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Patent Searching and Data


Title:
PROCESSING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/180767
Kind Code:
A1
Abstract:
A processing system equipped with a plurality of processing devices for executing workpiece processing, an inspection device which is capable of inspecting a workpiece which has been processed by the processing devices, and a control device for controlling the processing by the processing devices and the inspection by the inspection device, wherein the control device is provided with a generation unit for generating workpiece position information which indicates whether or not the workpiece introduced to the processing system is in any of the positions on the processing system, a determination unit for causing the inspection device to inspect an inspection reference device, and determining, on the basis of the workpiece position information generated by the generation unit, whether or not it is necessary to perform inspection reference value update processing for updating the inspection reference value used by the inspection device from the inspection results, and an execution unit for causing the inspection device to execute the inspection reference value update processing when the determination unit has determined that the inspection reference value update processing is necessary.

Inventors:
OGAWA MASASHI (JP)
Application Number:
PCT/JP2021/007263
Publication Date:
September 01, 2022
Filing Date:
February 26, 2021
Export Citation:
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Assignee:
FUJI CORP (JP)
International Classes:
B23Q17/20; B23Q17/00
Foreign References:
JPH06653U1994-01-11
JP2010184773A2010-08-26
JPH05208344A1993-08-20
JP2010105129A2010-05-13
JPS6165771A1986-04-04
Attorney, Agent or Firm:
KIMURA Gunji et al. (JP)
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