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Title:
PRODUCT DEFECT DETECTION METHOD AND APPARATUS, DEVICE AND COMPUTER-READABLE STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/148109
Kind Code:
A1
Abstract:
Disclosed are a product defect detection method and apparatus, a device and a computer-readable storage medium, the method comprising: extracting features of a product image of a target product to obtain a feature map; for each anchor point in the feature map, generating an anchor box that has a first preset size, a preset length-to-width ratio and a preset rotation angle; and classifying the anchor boxes to obtain detection results of whether the anchor boxes contain defects. According to the present invention, subtle defects in different directions in a product can be more adequately positioned, so that the defect detection accuracy of the product is improved.

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Inventors:
YU RUITAO (CN)
GAO WEI (CN)
Application Number:
PCT/CN2021/126935
Publication Date:
July 14, 2022
Filing Date:
October 28, 2021
Export Citation:
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Assignee:
GOERTEK INC (CN)
International Classes:
G06K9/62; G06T7/00; G06T7/68; G06T7/73
Foreign References:
CN112712513A2021-04-27
CN112085735A2020-12-15
CN110414464A2019-11-05
CN108875577A2018-11-23
CN110163841A2019-08-23
US20130336575A12013-12-19
US20190347828A12019-11-14
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