Title:
PROJECTION OPTICAL SYSTEM, EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/111104
Kind Code:
A1
Abstract:
Provided is a projection optical system, which has a relatively large image side numerical aperture of, for instance, 0.45 or larger, and can inspect the plane shape error of a reflection plane with a prescribed accuracy. The projection optical system is provided with a first reflecting imaging optical system (G1) for forming an intermediate image of a first plane based on light from a first plane (4), and a second reflecting imaging optical system (G2) for forming a reduced image on a second plane (7) based on light from the intermediate image. The first reflecting imaging optical system (G1) is provided with a first concave reflection mirror (M1), a second convex reflection mirror (M2), a third reflection mirror (M3) and a fourth concave reflection mirror (M4). The second reflecting imaging optical system (G2) is provided with a fifth concave reflection mirror (M5), a sixth reflection mirror (M6), a seventh convex reflection mirror (M7) and an eighth concave reflection mirror (M8). The conditions of 1
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Inventors:
TAKAHASHI TOMOWAKI (JP)
Application Number:
PCT/JP2007/054500
Publication Date:
October 04, 2007
Filing Date:
March 08, 2007
Export Citation:
Assignee:
NIKON CORP (JP)
TAKAHASHI TOMOWAKI (JP)
TAKAHASHI TOMOWAKI (JP)
International Classes:
G02B17/00; G03F7/20; H01L21/027
Foreign References:
JP2005315918A | 2005-11-10 | |||
US6710917B2 | 2004-03-23 | |||
JP2002139672A | 2002-05-17 |
Other References:
See also references of EP 2000840A4
Attorney, Agent or Firm:
YAMAGUCHI, Takao (10 Kanda-tsukasacho 2-chome,Chiyoda-k, Tokyo 48, JP)
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