Title:
QUALITY EVALUATION DEVICE AND INSPECTION MANAGEMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/196003
Kind Code:
A1
Abstract:
This quality evaluation device comprising: a non-defective image acquisition unit which acquires a non-defective image that is an inspection image determined as non-defective in an inspection process using a first trained learning apparatus generated by machine-learning with, as learning data, an inspection image generated by capturing an image of a subject to be inspected and, as teaching data, inspection results; a quality change evaluation unit which evaluates a change in quality of the subject to be inspected; and a quality evaluation information generation unit which generates quality evaluation information including the results of the evaluation.
Inventors:
MOCHIZUKI AOI (JP)
FUJII SHIMPEI (JP)
FUJII SHIMPEI (JP)
Application Number:
PCT/JP2021/047106
Publication Date:
September 22, 2022
Filing Date:
December 20, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G06T7/00; G01N21/88; G01N21/956
Domestic Patent References:
| WO2019138655A1 | 2019-07-18 |
Foreign References:
| JP2010249547A | 2010-11-04 | |||
| JP2020187071A | 2020-11-19 | |||
| JP2019049778A | 2019-03-28 | |||
| JP2010140444A | 2010-06-24 | |||
| US20170082555A1 | 2017-03-23 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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