Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
RECTANGULAR CELL FOR PHOTOMETRIC ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2021/074965
Kind Code:
A1
Abstract:
This rectangular cell 1 is attached to a photometric analysis device and is a closed-ended rectangular cell having one end surface open to accommodate a test sample. The rectangular cell 1 is provided with, on the lower side of the outer surface of a wall surface through which measurement light emitted by the analysis device passes when the rectangular cell 1 is attached to the analysis device, a low region that is a flat region recessed further toward the inner surface side, by only 0.01 mm for example, in comparison to a flat region on the upper side of said outer surface. This low region extends across substantially the entire horizontal width. As a result, when the rectangular cell 1 is attached to a recessed section provided in the analysis device, even if fine, hard debris adheres to a side surface of this recessed section, the region of the rectangular cell 1 where the measurement light passes through will not be damaged by the debris. Moreover, since this low region extends across substantially the entire horizontal width, the low region can be given a mirror finish by polishing with a polishing material.

Inventors:
YUASA KENJI (JP)
IGARASHI TAKAYUKI (JP)
Application Number:
PCT/JP2019/040488
Publication Date:
April 22, 2021
Filing Date:
October 15, 2019
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
YEP CO LTD (JP)
International Classes:
G01N21/03
Domestic Patent References:
WO2007063791A12007-06-07
Foreign References:
JP2017534854A2017-11-24
JPH10273331A1998-10-13
JP2007534928A2007-11-29
JP2009133769A2009-06-18
US4634575A1987-01-06
CN201340388Y2009-11-04
Attorney, Agent or Firm:
ASAHI PATENT FIRM (JP)
Download PDF: