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Title:
REFERENCE LIGHT SOURCE DEVICE USED FOR CALIBRATIOM OF SPECTRAL LUMINANCE METER AND CALIBRATION METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2016/151778
Kind Code:
A1
Abstract:
The present invention reduces luminance unevenness at a luminance reference surface. Provided is a reference light source device (10) used for calibration of a spectral luminance meter (40) and including an integrating sphere (12) provided with a luminance reference surface (18) that is an opening and a plurality of first optical ports (14a, 14b) that cause light rays with equivalent wavelength characteristics to enter the interior of the integrating sphere (12). The plurality of first optical ports (14a, 14b) may be provided at a plurality of positions on the outer wall (12b) of the integrating sphere (12) that are equidistant from the center of the luminance reference surface (18) and that have rotational symmetry with respect to a rotation symmetry axis R of the integrating sphere (12) passing through the center of the luminance reference surface (18).

Inventors:
SHIRAIWA HISASHI (JP)
SANO HIROYUKI (JP)
Application Number:
PCT/JP2015/058991
Publication Date:
September 29, 2016
Filing Date:
March 24, 2015
Export Citation:
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Assignee:
OTSUKA DENSHI KK (JP)
International Classes:
G01J3/02; G01J3/10
Foreign References:
JP2006177813A2006-07-06
JP2009092397A2009-04-30
JP2003331631A2003-11-21
JPH05231940A1993-09-07
JPH07301565A1995-11-14
JP2014020952A2014-02-03
JP2010078418A2010-04-08
JP2009052978A2009-03-12
JP2015045618A2015-03-12
Attorney, Agent or Firm:
HARUKA PATENT & TRADEMARK ATTORNEYS (JP)
Patent business corporation far international patent firm (JP)
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