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Title:
REFERENCE MARK DETECTION METHOD FOR PLANOGRAPHIC PRINTING PLATE, PROCESSING METHOD FOR PLANOGRAPHIC PRINTING PLATE, AND A PRINTING METHOD
Document Type and Number:
WIPO Patent Application WO/2015/122513
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a reference mark detection method with high reference mark detectability, a processing method with high punch position accuracy, and a printing method with high printing accuracy. This reference mark detection method for a planographic printing plate is characterized by involving a step a, in which an exposed planographic printing plate with a reference mark is prepared, a step b, an irradiation step in which an irradiation light source irradiates around the reference mark position of the planographic printing plate, and a step c, an imaging step in which an imaging device images the reference mark; a polarizing plate and a 1/4 wavelength phase difference plate are arranged between the irradiation light source and the planographic printing plate, and between the imaging device and the planographic printing plate.

Inventors:
SATO HIROKI (JP)
OSANAI RYUSUKE (JP)
Application Number:
PCT/JP2015/054059
Publication Date:
August 20, 2015
Filing Date:
February 16, 2015
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
B41N3/00; B41C1/10; B41F27/00; B41F33/00
Domestic Patent References:
WO2014017640A12014-01-30
WO2011122378A12011-10-06
Foreign References:
JP2010089384A2010-04-22
JP2008116867A2008-05-22
JPS5928610A1984-02-15
JPS59120806A1984-07-12
JP2007057985A2007-03-08
JP2011017577A2011-01-27
JP2013516649A2013-05-13
JP2003344032A2003-12-03
JPH04355139A1992-12-09
JP2010156620A2010-07-15
JP2002292820A2002-10-09
Attorney, Agent or Firm:
NOGUCHI YASUHIRO (JP)
Takahiro Noguchi (JP)
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