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Patent Searching and Data


Title:
REFRACTIVE PROPERTY MEASUREMENT DEVICE, MEASUREMENT TOOL, AND REFRACTIVE PROPERTY MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/137533
Kind Code:
A1
Abstract:
This refractive property measurement device for measuring the refractive properties of an eye via a subjective method comprises: a disc provided with first and second pinholes, each narrowing the light and letting the light pass therethrough; a light emitting unit that emits a first light and a second light from different positions in a plane parallel to the surface of the disc in such a manner that the light passing through the first and second pinholes enter the eye simultaneously; and a processing unit that determines the refractive properties of the eye from information regarding the positions on the retina of the eye where the first light that has passed through the first pinhole and the second light that has passed through the second pinhole arrive. The first pinhole has a first optical element having transmission properties that allow the first light to be transmitted but block the second light from being transmitted, and the second pinhole has a second optical element having transmission properties that allow the second light to be transmitted but block the first light from being transmitted.

Inventors:
IIZUKA TAKASHI (JP)
Application Number:
PCT/JP2019/048380
Publication Date:
July 02, 2020
Filing Date:
December 11, 2019
Export Citation:
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Assignee:
HOYA LENS THAILAND LTD (TH)
IIZUKA TAKASHI (JP)
International Classes:
A61B3/02
Foreign References:
US4943151A1990-07-24
US5988814A1999-11-23
US20020140903A12002-10-03
US3841760A1974-10-15
US20160363770A12016-12-15
US5988814A1999-11-23
Other References:
THIBOS, N. L.: "Principles of hartmann-shack aberrometry", JOURNAL OF REFRACTIVE SURGERY, vol. 16, 31 October 2000 (2000-10-31), pages S563 - S565, XP009009693
See also references of EP 3903663A4
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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