Title:
RESIDUAL DC MEASUREMENT DEVICE, RESIDUAL DC MEASUREMENT METHOD, AND RESIDUAL DC MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/183921
Kind Code:
A1
Abstract:
A residual DC measurement device according to the present invention receives light emitted from a display device, outputs a light reception signal, measures a flicker value of the display device on the basis of the light reception signal outputted during displaying of a flicker measurement image on the display device, stores the flicker value as an initial flicker value in a storage unit, then causes the display device to display a prescribed display image during a prescribed display period, causes the display device to display again the flicker measurement image after the lapse of the prescribed display period, measures a flicker value of the display device on the basis of the light reception signal outputted during displaying of the flicker measurement image, stores the flicker value as a post flicker value in the storage unit, and calculates a flicker change amount as an index value indicating a residual DC through an arithmetic operation of the post flicker value and the initial flicker value stored in the storage unit.
Inventors:
NISHIKAWA YOSHIHIRO (JP)
Application Number:
PCT/JP2020/002048
Publication Date:
September 17, 2020
Filing Date:
January 22, 2020
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
H04N17/04; G02F1/13; G02F1/133; G09G3/20; G09G3/3208; G09G3/36
Domestic Patent References:
| WO2013097907A1 | 2013-07-04 |
Foreign References:
| JP2004054226A | 2004-02-19 | |||
| JP2016126322A | 2016-07-11 | |||
| JP2009282332A | 2009-12-03 | |||
| JP2003255906A | 2003-09-10 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
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