Title:
RESIDUAL DC VOLTAGE EVALUATING METHOD AND EVALUATION DEVICE THEREFOR
Document Type and Number:
WIPO Patent Application WO/2007/141935
Kind Code:
A1
Abstract:
A residual DC voltage evaluating method for evaluating residual DC voltage produced
in a liquid crystal cell comprising a liquid crystal held between oriented films,
in which a plurality of sets of a combination of voltage applying time t during
which a voltage is applied to the liquid crystal cell externally with a residual
DC voltage VrDC produced by applying a voltage during the voltage applying
time t are measured, and the measurements plotted at a plurality of points as reference
signs (30) are curve-fitted using the expression 1. [Expression 1] VrDC(t)
= {q/CLC}{kanf /(kanf +
kd)}N[1-exp{-(kanf + kd)t}] Accordingly,
a residual DC voltage evaluating method is provided which can compare between
materials by obtaining parameters specific to liquid crystal materials and
oriented film materials.
Inventors:
MIZUSAKI MASANOBU
UCHIDA TATSUO
UCHIDA TATSUO
Application Number:
PCT/JP2007/053288
Publication Date:
December 13, 2007
Filing Date:
February 22, 2007
Export Citation:
Assignee:
SHARP KK (JP)
UNIV TOHOKU (JP)
MIZUSAKI MASANOBU
UCHIDA TATSUO
UNIV TOHOKU (JP)
MIZUSAKI MASANOBU
UCHIDA TATSUO
International Classes:
G02F1/1337; G02F1/13; G02F1/133
Foreign References:
| JPH11223816A | 1999-08-17 | |||
| JP2000351974A | 2000-12-19 |
Other References:
NAKAZONO Y. ET AL.: "A Novel Model of Residual DC in LC Cells", IDW'98, LCTP2-6, 1998, pages 61 - 64, XP008092611
INOUE M. ET AL.: "Recent Measurement of Liquid Crystal Material Characteristics", IDW'06, LCT7-1, 2006, pages 647 - 650, XP008092612
SAWADA A.: "Ion Sei Fujunbutsu ni Yoru Ekisho Zairyo no Dodensei ni Kansuru Kenkyu", EKISHO (ISSUED BY JAPANESE LIQUID CHRYSTAL SOCIETY), vol. 7, no. 4, 2003, pages 306 - 313, XP008092663
OKAMURA M. AND ICHINOSE H.: "Ekisho Kagaku Jikken Koza Dai 4 Kai: Ekisho Zairyo Tokusei no Sokutei Gijutsu (2)", EKISHO (ISSED BY JAPANSE LIQUID CRYSTAL SOCIETY), vol. 6, no. 4, 2002, pages 390 - 399, XP008092664
SASAKI T. ET AL.: "Ekisho Cell eno Chokuryu Chojo ni Yoru Tokaritsu Hendo Tokusei", TECHNICAL REPORT OF IEICE, EID93-128, 1994, pages 25 - 30, XP008091960
INOUE M. ET AL.: "Recent Measurement of Liquid Crystal Material Characteristics", IDW'06, LCT7-1, 2006, pages 647 - 650, XP008092612
SAWADA A.: "Ion Sei Fujunbutsu ni Yoru Ekisho Zairyo no Dodensei ni Kansuru Kenkyu", EKISHO (ISSUED BY JAPANESE LIQUID CHRYSTAL SOCIETY), vol. 7, no. 4, 2003, pages 306 - 313, XP008092663
OKAMURA M. AND ICHINOSE H.: "Ekisho Kagaku Jikken Koza Dai 4 Kai: Ekisho Zairyo Tokusei no Sokutei Gijutsu (2)", EKISHO (ISSED BY JAPANSE LIQUID CRYSTAL SOCIETY), vol. 6, no. 4, 2002, pages 390 - 399, XP008092664
SASAKI T. ET AL.: "Ekisho Cell eno Chokuryu Chojo ni Yoru Tokaritsu Hendo Tokusei", TECHNICAL REPORT OF IEICE, EID93-128, 1994, pages 25 - 30, XP008091960
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (2-6 Tenjinbashi 2-chome Kit, Kita-ku Osaka-shi Osaka 41, JP)
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