Title:
RESISTANCE MEASUREMENT DEVICE AND RESISTANCE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/101234
Kind Code:
A1
Abstract:
In the present invention, an intermediate substrate B comprises: a metal plate MP that is flatly spread out; substrate surfaces BS1 facing the metal plate MP; and pairs of electroconduction sections PA1-PF1 provided to the substrate surfaces BS1 and connection sections RA-RF electrically connecting the electroconduction sections to the metal plate MP, with three or more such pairs being provided. With respect to the intermediate substrate, the following are provided: a current supply unit CS for allowing current to flow via the metal plate MP between the electroconduction section PB1 (first electroconduction section) and the electroconduction section PC1 (second electroconduction section), from among the electroconduction sections PA1-PF1; a voltage detection unit VM1 for detecting a voltage between the electroconduction section PA1 (third electroconduction section) and the electroconduction section PB1 (first electroconduction section); and a resistance calculation unit 22 for calculating a resistance value of the connection section RB that is paired with the electroconduction section PB1 (first electroconduction section) on the basis of a current I passed in by the current supply unit CS and the voltage detected by the voltage detection unit VM1.
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Inventors:
TAKAHARA DAISUKE (JP)
Application Number:
PCT/JP2017/042511
Publication Date:
June 07, 2018
Filing Date:
November 28, 2017
Export Citation:
Assignee:
NIDEC READ CORP (JP)
International Classes:
G01R27/02; H05K3/00; G01R31/50
Foreign References:
| JP2013051355A | 2013-03-14 |
Attorney, Agent or Firm:
YANAGINO Takao et al. (JP)
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