RESONANCE SHEAR MEASUREMENT DEVICE

Title:

RESONANCE SHEAR MEASUREMENT DEVICE

Document Type and Number:

WIPO Patent Application WO/2020/194734

Kind Code:

A1

Abstract:

This resonance shear measurement device (1) comprises: an upper unit (10) having a piezoelectric element (15), an upper disk substrate (16), and a spring (17); and a lower unit (11) having a lower disk substrate (14), wherein a sample insertion part (21) is formed between the lower surface of the upper disk substrate (16) and the upper surface of the lower disk substrate (14), the piezoelectric element (15) and the upper disk substrate (16) are vibratably connected to a fixed apparatus (30) via the spring (17), a strain gauge (19) is attached to the spring (17), and by applying an AC voltage to the piezoelectric element (15) while changing a frequency thereof, a response voltage at a time of resonance from the strain gauge (19) according to the vibration of the upper unit (10) is measured.

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Inventors:

KURIHARA KAZUE (JP)
MIZUKAMI MASASHI (JP)
KASUYA MOTOHIRO (JP)

Application Number:

PCT/JP2019/013845

Publication Date:

October 01, 2020

Filing Date:

March 28, 2019

Export Citation:

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Assignee:

UNIV TOHOKU (JP)

International Classes:

G01N11/00

Domestic Patent References:

WO2007037241A1

2007-04-05

Foreign References:

JP2009058340A	2009-03-19
JPH0293302A	1990-04-04
JPS53124450U	1978-10-03
US20160274015A1	2016-09-22
JP4615568B2	2011-01-19
JPS6330212B2	1988-06-16

Other References:

MIZUKAMI MASASHI, KURIHARA KAZUE: "Resonance Shear Measurement on Nano-Confined Liquids and Friction Analysis (Special Issue of ''Progress in In-situ Measurement of Friction Interface", HYOMEN KAGAKU, vol. 38, no. 3, 10 March 2017 (2017-03-10), pages 117 - 122, XP009530073, DOI: 10.1380/jsssj.38.117
SHOGO SHIBASAKI ET AL.: "Resonance Shear Measurement on Lubrication Properties of Engine Oils: Effects of Additives", TRIBOLOGIST, vol. 63, no. 4, 6 February 2018 (2018-02-06), pages 284 - 293
See also references of EP 3951350A4

Attorney, Agent or Firm:

TANAI Sumio et al. (JP)

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