Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ROAD CONDITION DETECTION DEVICE AND ROAD CONDITION DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/228239
Kind Code:
A1
Abstract:
The purpose of the present disclosure is to inhibit the omission of imaging damaged locations of a road. This road condition detection device (101) comprises: an image processing unit (13) that image-analyzes a first image captured by a first imaging device (21) to thereby estimate damaged location candidates of a road as first damaged location candidates, together with calculating confidence scores for the first damaged location candidates; and a control unit (15) that, when the confidence scores of the first damaged location candidates are a reference value or lower, calculates an imaging timing at which the first damaged location candidates are included in an imaging range of a second imaging device (22) which is narrower than the first imaging device (21). The image processing unit (13) image-analyzes a second image captured at the imaging timing, thereby estimating damaged location candidates of the road included in the imaging range of the second image as second damaged location candidates, together with calculating confidence scores for the second damaged location candidates, and detecting, as damaged locations, the first damaged location candidates and the second damaged location candidates having a confidence score which exceeds the reference value.

Inventors:
UENO YOSHINORI (JP)
HAMADA TEPPEI (JP)
SHIMOTANI MITSUO (JP)
KITANI TETSU (JP)
Application Number:
PCT/JP2022/021086
Publication Date:
November 30, 2023
Filing Date:
May 23, 2022
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G08G1/00; E01C23/01
Domestic Patent References:
WO2021186989A12021-09-23
WO2021200038A12021-10-07
Foreign References:
JP2022026287A2022-02-10
JP2021026353A2021-02-22
JP2021002162A2021-01-07
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
Download PDF: