Title:
RUNWAY ILLUMINATION LAMP INSPECTION DEVICE AND RUNWAY ILLUMINATION LAMP INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2017/061286
Kind Code:
A1
Abstract:
Provided is a runway illumination lamp inspection device capable of determining the presence or absence of an abnormality in an illumination lamp requiring a minimum amount of data and in a short time. This runway illumination lamp inspection device is characterized by including an illumination lamp detection means (11), an image acquisition means (12), and a determination means (12), the illumination lamp detection means (11) detecting an illumination lamp (21) embedded in a runway (20), the image acquisition means (12) acquiring an image of the illumination lamp (21) when the illumination lamp detection means (11) has detected the illumination lamp (21), and the determination means (13) determining the presence or absence of an abnormality in the illumination lamp (21) on the acquired image of the illumination lamp (21).
Inventors:
MIZOBE NORIMASA (JP)
Application Number:
PCT/JP2016/078108
Publication Date:
April 13, 2017
Filing Date:
September 23, 2016
Export Citation:
Assignee:
NEC LIGHTING LTD (JP)
International Classes:
H05B37/03; F21S2/00; F21V23/00; F21W111/06
Foreign References:
| JP2011112621A | 2011-06-09 | |||
| JP2004146281A | 2004-05-20 | |||
| JPH07329895A | 1995-12-19 |
Attorney, Agent or Firm:
TSUJIMARU Koichiro et al. (JP)
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