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Patent Searching and Data


Title:
SAMPLE ANALYSIS SYSTEM AND SAMPLE MANAGEMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/062933
Kind Code:
A1
Abstract:
A sample analysis system and a sample management method. The sample analysis system comprises: one or more analysis devices (10) configured to test samples; a scan component (01) configured to scan a sample to obtain scanning information before sample test by the analysis devices (10); an image information acquisition component (02) configured to acquire image information of the area in a sample containing a sample identifier; a processor (03) configured to identify the sample identifier of a sample according to at least one of scan information or image information of the sample. The system can obtain the sample identifier of a sample in two ways, thus improving the efficiency of sample test.

Inventors:
HUANG XINYUAN (CN)
ZENG FANSHUN (CN)
Application Number:
PCT/CN2019/120780
Publication Date:
April 08, 2021
Filing Date:
November 26, 2019
Export Citation:
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Assignee:
SHENZHEN MINDRAY BIOMEDICAL ELECTRONICS CO LTD (CN)
International Classes:
G01N35/00; G01N35/02
Foreign References:
CN108089019A2018-05-29
CN104569461A2015-04-29
CN105277726A2016-01-27
CN105518462A2016-04-20
CN104395759A2015-03-04
CN107076732A2017-08-18
US20150316451A12015-11-05
JP2013011481A2013-01-17
Attorney, Agent or Firm:
DHC IP ATTORNEYS (CN)
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