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Patent Searching and Data


Title:
SAMPLING CIRCUIT AND TESTER
Document Type and Number:
WIPO Patent Application WO/2006/051694
Kind Code:
A1
Abstract:
A circuit for sampling input signals comprising a pulser generating a pulse signal depending on timing at which the input signal is to be sampled, a step recovery diode outputting a sampling pulse depending on the pulse signal, a detector for detecting the value of the input signal depending on the sampling pulse, a circuit for detecting the temperature in the vicinity of the step recovery diode, and a temperature compensating section for controlling the sampling pulse outputting timing by the step recovery diode based on the temperature detected by the temperature detection circuit.

Inventors:
YAMAKAWA MASAHIRO (JP)
UMEMURA YOSHIHARU (JP)
AWAJI TOSHIAKI (JP)
SHIWA SATOSHI (JP)
Application Number:
PCT/JP2005/019806
Publication Date:
May 18, 2006
Filing Date:
October 27, 2005
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
YAMAKAWA MASAHIRO (JP)
UMEMURA YOSHIHARU (JP)
AWAJI TOSHIAKI (JP)
SHIWA SATOSHI (JP)
International Classes:
H03K3/313; H03K17/00
Foreign References:
JPH10112636A1998-04-28
JPH0563447A1993-03-12
Attorney, Agent or Firm:
Ryuka, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo, JP)
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