Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SCANNING OPTICAL SYSTEM AND SCANNING LENS
Document Type and Number:
WIPO Patent Application WO/2020/183707
Kind Code:
A1
Abstract:
Provided is a scanning optical system, wherein, with a scanning direction on a surface as a y-axis, a principal ray perpendicularly incident on the surface as a z-axis, a reflection point on the deflector of the principal ray as an origin point, the distance from the origin point to the surface as L, the length of a scanning path on the surface as W, the maximum value and the minimum value of the y-coordinate of a point at which the principal ray passes an emission surface of the scanning lens as ymax and ymin, respectively, the curvature in a main scanning direction of the emission surface at the point as c, and the refractive index of a material as n, power Φ = (1-n)∙c in the main scanning direction at the point is defined, and with the maximum value of the absolute value of dΦ/dy in ranges from ymin to 0.6ymin and from 0.6ymax to ymax as |dΦ/dy|out, and the maximum value of the absolute value of dΦ/dy in a range from 0.6ymin to 0.6ymax as |dΦ/dy|in, 0.54 ≤ L/W ≤ 0.64 |dΦ/dy|out/|dΦ/dy|in ≤ 0.5 is satisfied.

Inventors:
KUWAGAITO TOMOHITO (JP)
Application Number:
PCT/JP2019/010570
Publication Date:
September 17, 2020
Filing Date:
March 14, 2019
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NALUX CO LTD (JP)
International Classes:
G02B26/10; B41J2/47; G02B3/00; G02B13/18; G02B13/24; G02B26/12; H04N1/113
Foreign References:
JP2016194675A2016-11-17
JP2003215444A2003-07-30
JP2002006211A2002-01-09
EP1995623A22008-11-26
Attorney, Agent or Firm:
FUSHIMI, Naoya (JP)
Download PDF: