Title:
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA PIEZO-PROBES
Document Type and Number:
WIPO Patent Application WO/2023/049225
Kind Code:
A3
Abstract:
A scattering-type scanning near-field optical microscope at cryogenic temperatures (cryo-SNOM) configured with Akiyama probes for studying low energy excitations in quantum materials present in high magnetic fields. The s-SNOM is provided with atomic force microscopy (AFM) control, which predominantly utilizes a laser-based detection scheme for determining the cantilever tapping motion of metal-coated Akiyama probes, where the cantilever tapping motion is detected through a piezoelectric signal. The Akiyama-based cryo-SNOM attains high spatial resolution, good near-field contrast, and is able to perform imaging with a significantly more compact system capable of handling simultaneous demands of vibration isolation, low base temperature, precise nano-positioning, and optical access. Results establish the potential of s-SNOM based on self-sensing piezo-probes, which can easily accommodate near-IR and far-infrared wavelengths and high magnetic fields. Using a tuning fork-based Akiyama probe provides nano-imaging capability at room and low temperatures and is used for near-field photocurrent mapping.
Inventors:
DAPOLITO MICHAEL (US)
LIU MEGKUN (US)
CHEN XINZHONG (US)
GOZAR ADRIAN (US)
LIU MEGKUN (US)
CHEN XINZHONG (US)
GOZAR ADRIAN (US)
Application Number:
PCT/US2022/044311
Publication Date:
April 27, 2023
Filing Date:
September 22, 2022
Export Citation:
Assignee:
UNIV NEW YORK STATE RES FOUND (US)
UNIV YALE (US)
UNIV YALE (US)
International Classes:
G02B6/122; A61B18/22; G01Q20/04
Foreign References:
| US20130333077A1 | 2013-12-12 | |||
| US6211988B1 | 2001-04-03 | |||
| US20180259553A1 | 2018-09-13 |
Other References:
YANG ET AL.: "A cryogenic scattering-type scanning near-field optical microscope", REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 84, no. 2, 1 February 2013 (2013-02-01), pages 023701, XP012174574, DOI: 10.1063/1.4789428
AKIYAMA ET AL.: "Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy", REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 74, no. 1, 16 January 2003 (2003-01-16), pages 112 - 117, XP012040184, DOI: 10.1063/1.1523631
ROGERS ET AL.: "Improving tapping mode atomic force microscopy with piezoelectric cantilevers", ULTRAMICROSCOPY, vol. 100, no. 3-4, 1 August 2004 (2004-08-01), pages 267 - 276, XP055415789, DOI: 10.1016/j.ultramic.2004.01.016
FEI Z., RODIN A. S., GANNETT W., DAI S., REGAN W., WAGNER M., LIU M. K., MCLEOD A. S., DOMINGUEZ G., THIEMENS M., CASTRO NETO ANTO: "Electronic and plasmonic phenomena at graphene grain boundaries", NATURE NANOTECHNOLOGY, NATURE PUB. GROUP, INC., LONDON, vol. 8, no. 11, 1 November 2013 (2013-11-01), London , pages 821 - 825, XP093064989, ISSN: 1748-3387, DOI: 10.1038/nnano.2013.197
ADAMS ET AL.: "Self-sensing tapping mode atomic force microscopy", SENSORS AND ACTUATORS A: PHYSICAL, vol. 121, no. 1, 31 May 2005 (2005-05-31), pages 262 - 266, XP025325071, DOI: 10.1016/j.sna.2004.12.030
DAPOLITO ET AL.: "Scattering-type scanning near-field optical microscopy with Akiyama piezo- probes", APPLIED PHYSICS LETTERS, vol. 120, no. 1, 5 January 2022 (2022-01-05), pages 013104, XP012262599, DOI: 10.1063/5.0074804
AKIYAMA ET AL.: "Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy", REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 74, no. 1, 16 January 2003 (2003-01-16), pages 112 - 117, XP012040184, DOI: 10.1063/1.1523631
ROGERS ET AL.: "Improving tapping mode atomic force microscopy with piezoelectric cantilevers", ULTRAMICROSCOPY, vol. 100, no. 3-4, 1 August 2004 (2004-08-01), pages 267 - 276, XP055415789, DOI: 10.1016/j.ultramic.2004.01.016
FEI Z., RODIN A. S., GANNETT W., DAI S., REGAN W., WAGNER M., LIU M. K., MCLEOD A. S., DOMINGUEZ G., THIEMENS M., CASTRO NETO ANTO: "Electronic and plasmonic phenomena at graphene grain boundaries", NATURE NANOTECHNOLOGY, NATURE PUB. GROUP, INC., LONDON, vol. 8, no. 11, 1 November 2013 (2013-11-01), London , pages 821 - 825, XP093064989, ISSN: 1748-3387, DOI: 10.1038/nnano.2013.197
ADAMS ET AL.: "Self-sensing tapping mode atomic force microscopy", SENSORS AND ACTUATORS A: PHYSICAL, vol. 121, no. 1, 31 May 2005 (2005-05-31), pages 262 - 266, XP025325071, DOI: 10.1016/j.sna.2004.12.030
DAPOLITO ET AL.: "Scattering-type scanning near-field optical microscopy with Akiyama piezo- probes", APPLIED PHYSICS LETTERS, vol. 120, no. 1, 5 January 2022 (2022-01-05), pages 013104, XP012262599, DOI: 10.1063/5.0074804
Attorney, Agent or Firm:
GROLZ, Edward (US)
Download PDF:
Previous Patent: MULTI-COLOR VARIABLE TRANSMISSION OPTICAL DEVICE
Next Patent: SYSTEMS AND METHODS FOR DIRECT USE OF SOLAR ENERGY
Next Patent: SYSTEMS AND METHODS FOR DIRECT USE OF SOLAR ENERGY