Title:
SCINTILLATOR ARRAY, METHOD OF MANUFACTURING SCINTILLATOR ARRAY, RADIATION DETECTOR, AND RADIATION INSPECTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/105611
Kind Code:
A1
Abstract:
This scintillator array is provided with: a first scintillator element; a second scintillator element; and a reflector which is provided between the first and second scintillator elements, and the width of which between the first and second scintillator elements is at most equal to 80 μm. Each of the first and second scintillator elements is provided with a polycrystalline body containing rare earth oxysulfide phosphor, and each polycrystalline body has a radiation incidence surface with a surface area of 1 mm or less × 1 mm or less. The average crystal grain diameter of the crystal grains in the polycrystalline body is at least equal to 5 μm and at most equal to 30 μm, where the average crystal grain diameter is defined to be the average segment length of crystal grains measured in an observation image obtained by observing the polycrystalline body using a scanning electron microscope. The maximum length or maximum diameter of defects present in the surface of the polycrystalline body is at most equal to 40 μm.
Inventors:
HAYASHI MAKOTO (JP)
KONDO HIROYASU (JP)
ICHIKAWA HIROSHI (JP)
ADACHI YOSHITAKA (JP)
FUKUTA YUKIHIRO (JP)
KONDO HIROYASU (JP)
ICHIKAWA HIROSHI (JP)
ADACHI YOSHITAKA (JP)
FUKUTA YUKIHIRO (JP)
Application Number:
PCT/JP2017/043646
Publication Date:
June 14, 2018
Filing Date:
December 05, 2017
Export Citation:
Assignee:
TOSHIBA KK (JP)
TOSHIBA MATERIALS CO LTD (JP)
TOSHIBA MATERIALS CO LTD (JP)
International Classes:
G21K4/00; A61B6/03; G01T1/20
Domestic Patent References:
| WO2016047139A1 | 2016-03-31 | |||
| WO2004077098A1 | 2004-09-10 |
Foreign References:
| JPS5241979B2 | 1977-10-21 | |||
| JPH0516756B2 | 1993-03-05 |
Other References:
See also references of EP 3553792A4
Attorney, Agent or Firm:
SAKURA PATENT OFFICE, P.C. (JP)
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