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Title:
SECONDARY BATTERY INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2013/061754
Kind Code:
A1
Abstract:
In this secondary battery inspection method, a secondary battery is charged, aging test of the secondary battery after the charging is performed in a predetermined environment for a predetermined period, and whether there is metallic contamination or not is determined on the basis of a change of a voltage of the secondary battery after the aging test. Free electrons in a negative-electrode active material are increased by performing auxiliary charging of the secondary battery in predetermined timing during a period when the aging test is performed. Since metallic ions are deposited by bonding to the free electrons, deposition speed of the metallic ions is increased by increasing the free electrons, and a time required for the aging test is shortened.

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Inventors:
YAMAGUCHI TAKESHI (JP)
Application Number:
PCT/JP2012/075915
Publication Date:
May 02, 2013
Filing Date:
October 05, 2012
Export Citation:
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Assignee:
NISSAN MOTOR (JP)
International Classes:
H01M10/058; H01M10/04
Foreign References:
JP2003036887A2003-02-07
JPH06349524A1994-12-22
JP2005209528A2005-08-04
JP2005158643A2005-06-16
JP2006086060A2006-03-30
JP2005251538A2005-09-15
Attorney, Agent or Firm:
GOTO, Masaki et al. (JP)
Masaki Goto (JP)
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