Title:
SEMICONDUCTOR DEVICE, INFRARED IMAGING DEVICE EQUIPPED WITH SAID SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/162876
Kind Code:
A1
Abstract:
The purpose of the present invention is to shorten the time needed for the terminal voltage of a bolometer element to converge to a bias voltage, shorten the reset interval of an integration circuit, and improve the temperature resolution. This semiconductor device is provided with a means for presenting a bias voltage to a bolometer element. A bias circuit that inputs to an integration circuit the differential current of the current flowing to the bolometer element when the bias voltage is presented to the bolometer element, and the current from a bias cancel circuit that eliminates offset current of the bolometer element, pre-charges the bolometer element at a prescribed pre-charge voltage.
Inventors:
OKUYAMA KUNIYUKI (JP)
Application Number:
PCT/JP2015/002080
Publication Date:
October 29, 2015
Filing Date:
April 15, 2015
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01J1/42; H04N5/33
Domestic Patent References:
| WO2013038911A1 | 2013-03-21 |
Foreign References:
| JP2010283514A | 2010-12-16 | |||
| JPH10148570A | 1998-06-02 | |||
| JP2008022457A | 2008-01-31 | |||
| JP2004532977A | 2004-10-28 |
Other References:
See also references of EP 3139140A4
Attorney, Agent or Firm:
SHIMOSAKA, NAOKI (JP)
Naoki Shimosaka (JP)
Naoki Shimosaka (JP)
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