SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING SEMICONDUCTOR DEVICE

WIPO Patent Application WO/2021/038349

A1

The present invention provides a novel comparison circuit, a novel amplifier circuit, a novel battery control circuit, a novel battery protection circuit, a power storage device, a semiconductor device, an electrical apparatus, and the like. A semiconductor device wherein: one of a source and drain of a first transistor, one of a source and drain of a second transistor, and one of a source and drain of a third transistor are electrically connected; the other of the source and drain of the third transistor are electrically connected to a first output terminal; the other of the source and drain of the second transistor is electrically connected to a second output terminal; exists a function for outputting, from the first output terminal and the second output terminal, a comparison result of a signal applied to a gate of the second transistor and a signal applied to a gate of the third transistor; and exists a function for changing a potential outputted from the first output terminal in response to a potential applied to a back gate of the first transistor.

JPS5353281	SEMICONDUCTOR INTEGRATING CIRCUIT
JP4546054	Manufacturing method of semiconductor devices
JPS63108763	SEMICONDUCTOR INTEGRATED CIRCUIT

TAKAHASHI KEI
AOKI TAKESHI (JP)
KOZUMA MUNEHIRO (JP)
IKEDA TAKAYUKI (JP)

PCT/IB2020/057528

March 04, 2021

August 11, 2020

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SEMICONDUCTOR ENERGY LAB (JP)

H01L21/822; H03K5/08; H01L21/8234; H01L27/04; H01L27/06; H01L27/088; H01L29/786; H03F3/45

WO2010082239A1

2010-07-22

JP2006352607A	2006-12-28
JP2003142598A	2003-05-16
JP2017192124A	2017-10-19
JPH08125504A	1996-05-17
JP2010050590A	2010-03-04

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