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Title:
SENSOR PORTION OF SPECTROSCOPIC ANALYSIS DEVICE, MEASURING SYSTEM, AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/070544
Kind Code:
A1
Abstract:
This sensor portion for a spectroscopic analysis device is provided with a tip end portion equipped internally with an optical system for emitting measurement light onto a measurement target substance of which physical property data are to be measured, and capturing returned light from the measurement target substance, the tip end portion being fitted into a container for a fluid that includes the measurement target substance, wherein the tip end portion includes: an opposing wall surface that opposes an emission surface of the measurement light of the optical system; and a holding portion that projects from the emission surface side toward the opposing wall surface side, and that holds the opposing wall surface in a state in which a space through which the fluid flows is provided between the emission surface and the opposing wall surface, the holding portion including an inflow port and outflow port for the fluid, and side wall surfaces disposed on both sides in a direction of flow of the fluid.

Inventors:
NISHI TAKAYUKI (JP)
HASEGAWA MASATAKA (JP)
Application Number:
PCT/JP2023/032536
Publication Date:
April 04, 2024
Filing Date:
September 06, 2023
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N21/05; G01N21/65
Domestic Patent References:
WO2021215179A12021-10-28
Foreign References:
JP2013134235A2013-07-08
JP2010185694A2010-08-26
JP2020112428A2020-07-27
US5781306A1998-07-14
JP2020511635A2020-04-16
JP2021048872A2021-04-01
JP2002174596A2002-06-21
JP2021518559A2021-08-02
Attorney, Agent or Firm:
TAIYO, NAKAJIMA & KATO (JP)
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