Title:
SERVICE LIFE DIAGNOSTIC DEVICE AND POWER CONVERSION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/264270
Kind Code:
A1
Abstract:
A service life diagnostic device (1) comprises a Vce amplifier (12), a Vee amplifier (13), and a service life diagnostic unit (21). The Vce amplifier (12) measures a voltage (Vce) between a collector main terminal (6) connected to a collector electrode of a semiconductor element (5) mounted to a semiconductor device (2) and an emitter main terminal (8) connected to an emitter electrode of the semiconductor element (5). The Vee amplifier (13) measures a voltage Vee between the emitter main terminal (8) and an emitter reference terminal (9) connected to the emitter electrode. The service life diagnostic unit (21) diagnoses the service life of the semiconductor device (2) using the value of a correlation between the change over time of the voltage Vce and the change over time of the voltage Vee.
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Inventors:
WADA YUKIHIKO (JP)
Application Number:
PCT/JP2021/022706
Publication Date:
December 22, 2022
Filing Date:
June 15, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R31/26
Foreign References:
| JP2012018025A | 2012-01-26 | |||
| JP2009019953A | 2009-01-29 | |||
| JP2020155660A | 2020-09-24 | |||
| JP2019052855A | 2019-04-04 | |||
| JP2010081796A | 2010-04-08 | |||
| JPS5828673A | 1983-02-19 | |||
| JPH04369241A | 1992-12-22 | |||
| US20090099819A1 | 2009-04-16 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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