Title:
SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/243173
Kind Code:
A1
Abstract:
This shape measurement method is for measuring the three-dimensional shape of the surface of a measured object and includes a step for dividing the surface of the measured object into a plurality of measurement regions, a step for acquiring a plurality of pieces of partial measurement data, a step for calculating a first coordinate conversion parameter for global alignment of the plurality of pieces of partial measurement data, a step for acquiring error calculation data that includes respective normal lines to a plurality of measurement points for the plurality of pieces of partial measurement data, a step for extracting overlap regions on the basis of the plurality of pieces of partial measurement data and the first coordinate conversion parameter, a step for calculating a second coordinate conversion parameter for local alignment of the plurality of pieces of partial measurement data at the extracted overlap regions on the basis of the error calculation data, and a step for generating synthesized data that synthesizes the plurality of pieces of partial measurement data on the basis of the first coordinate conversion parameter and the second coordinate conversion parameter.
Inventors:
SAKUMA TATSUYA
Application Number:
PCT/JP2023/011231
Publication Date:
December 21, 2023
Filing Date:
March 22, 2023
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01B21/20; G01B5/20
Domestic Patent References:
| WO2015076343A1 | 2015-05-28 | |||
| WO2011061843A1 | 2011-05-26 |
Foreign References:
| JP2009168475A | 2009-07-30 | |||
| JP2015064241A | 2015-04-09 |
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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