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Title:
SILICON CARBIDE SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/027584
Kind Code:
A1
Abstract:
This silicon carbide semiconductor device is provided with a silicon carbide semiconductor layer (100) and an electrode layer (101) that establishes an ohmic contact with the silicon carbide semiconductor layer (100). With respect to the electrode layer (101), the value of CI/CA, which is obtained by dividing the atomic concentration of carbon CI in the interface (IF) between the silicon carbide semiconductor layer (100) and the electrode layer (101) by the average atomic concentration of carbon CA within the electrode layer (101), satisfies 1.0 ≤ CI/CA ≤ 3.0.

Inventors:
YAMAMOTO HIROFUMI (JP)
TAMASO HIDETO (JP)
KITABAYASHI HIROYUKI (JP)
WADA KEIJI (JP)
MATSUKAWA SHINJI (JP)
Application Number:
PCT/JP2015/069723
Publication Date:
February 25, 2016
Filing Date:
July 09, 2015
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
H01L21/28; H01L21/336; H01L29/12; H01L29/739; H01L29/78
Foreign References:
JP2012099598A2012-05-24
JP2010103229A2010-05-06
JP2012099599A2012-05-24
JP2012248873A2012-12-13
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
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