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Patent Searching and Data


Title:
SIR MEASUREMENT DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2003/090372
Kind Code:
A1
Abstract:
An SIR measurement device capable of measuring SIR after removing interference in a short time after reception with a high accuracy without performing JD demodulation. In this device, a delay profile is created by using a midamble and an SIR is measured by using the delay profile and an estimated path position. That is, a signal power measurement unit (142) measures a signal power from the delay profile and the selected path position and an interference power measurement unit (144) measures an interference power from the delay profile and the selected path position. A signal power correction unit (146) and an interference power correction unit (148) perform necessary corrections. An SIR calculation unit (150) calculates an SIR according to a predetermined calculation equation.

Inventors:
SETO YOSHITAKA (JP)
NISHIO AKIHIKO (JP)
Application Number:
PCT/JP2003/005029
Publication Date:
October 30, 2003
Filing Date:
April 21, 2003
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD (JP)
SETO YOSHITAKA (JP)
NISHIO AKIHIKO (JP)
International Classes:
H04B1/707; H04B1/711; H04B1/7113; H04B7/26; H04B17/00; H04B17/336; H04W24/00; H04W88/02; (IPC1-7): H04B1/707
Foreign References:
JP2001285127A2001-10-12
JP2001285209A2001-10-12
JP2003032168A2003-01-31
JP2003134060A2003-05-09
JP2001285180A2001-10-12
Attorney, Agent or Firm:
Washida, Kimihito (Shintoshicenter Bldg. 24-1, Tsurumaki 1-chom, Tama-shi Tokyo, JP)
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