Title:
SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUS
Document Type and Number:
WIPO Patent Application WO/2020/203222
Kind Code:
A1
Abstract:
The purpose of the present invention is to cause avalanche amplification stably while suppressing a decrease in resolution. A solid-state imaging device according to an embodiment is provided with: a photoelectric conversion region (102) provided in an element region defined by a trench in a semiconductor substrate (101); a first semiconductor region (104) surrounding the photoelectric conversion region; a first contact (108) in contact with the first semiconductor region at the bottom of the trench; a second semiconductor region (105) which is provided in a region adjoining the first semiconductor region and has the same first conductivity type as the first semiconductor region; a third semiconductor region (106) which is a region adjoining the second semiconductor region and provided between the second semiconductor region and a first surface, and which has a second conductivity type opposite to the first conductivity type; and a second contact (107) provided on the first surface so as to adjoin the third semiconductor region. The height of the first contact from the first surface is different from the height of the third semiconductor region from the first surface.
Inventors:
KAWAHARA YUKI (JP)
Application Number:
PCT/JP2020/011455
Publication Date:
October 08, 2020
Filing Date:
March 16, 2020
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H01L31/107; H01L27/146; H01L31/10; H04N5/369
Domestic Patent References:
| WO2018212175A1 | 2018-11-22 | |||
| WO2018174090A1 | 2018-09-27 | |||
| WO2017187957A1 | 2017-11-02 |
Foreign References:
| US10204950B1 | 2019-02-12 | |||
| JP2019033136A | 2019-02-28 | |||
| JP2018201005A | 2018-12-20 | |||
| JP2018088488A | 2018-06-07 | |||
| JP2012178457A | 2012-09-13 | |||
| JP2015041746A | 2015-03-02 |
Other References:
See also references of EP 3951893A4
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
Download PDF: