Title:
SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND METHOD FOR CONTROLLING SOLID-STATE IMAGING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2021/039142
Kind Code:
A1
Abstract:
In this solid-state imaging element that detects presence or absence of an address event, miniaturization of pixels is facilitated. This solid-state imaging element is provided with a plurality of detection pixels and a detection circuit. In the solid-state imaging element provided with the detection pixels and the detection circuit, each of the detection pixels generates a voltage signal in accordance with a logarithmic value of a photoelectric current. Further, in the solid-state imaging element provided with the detection pixels and the detection circuit, the detection circuit detects whether a change amount of the voltage signal of a detection pixel, among the detection pixels, indicated by an inputted selection signal exceeds a prescribed threshold value.
Inventors:
NIWA ATSUMI (JP)
Application Number:
PCT/JP2020/026747
Publication Date:
March 04, 2021
Filing Date:
July 08, 2020
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/351; H04N5/3745; H04N5/378
Domestic Patent References:
| WO2019146527A1 | 2019-08-01 | |||
| WO2019150786A1 | 2019-08-08 |
Foreign References:
| JP2017050853A | 2017-03-09 | |||
| JPS5244587B2 | 1977-11-09 |
Other References:
See also references of EP 4024850A4
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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