Title:
SPECIMEN ANALYZING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2006/004176
Kind Code:
A1
Abstract:
A specimen analyzing element, comprising a transparent member (1) in which a micro flow passage (2) is formed, a pair of bar-like members (3, 4) buried in the transparent member (1), having end faces (3b, 4c) disposed oppositely to each other through the micro flow passage (2) formed in the transparent member (1), and having a refraction factor different from that of the transparent member (1), and a scattered light condensing part (31) buried in the transparent member (1) and condensing scattered light from a measurement part (2a).
Inventors:
OHKUBO TOSHIFUMI (JP)
YOSHIDA YOSHIKAZU (JP)
YOSHIDA YOSHIKAZU (JP)
Application Number:
PCT/JP2005/012527
Publication Date:
January 12, 2006
Filing Date:
June 30, 2005
Export Citation:
Assignee:
TAMA TLO CORP (JP)
TERADA NOBUYUKI (JP)
OHKUBO TOSHIFUMI (JP)
YOSHIDA YOSHIKAZU (JP)
TERADA NOBUYUKI (JP)
OHKUBO TOSHIFUMI (JP)
YOSHIDA YOSHIKAZU (JP)
International Classes:
G01N21/05; G01N15/14; G01N21/47; G01N37/00; (IPC1-7): G01N21/05; G01N15/14; G01N21/47; G01N37/00
Domestic Patent References:
| WO2003054525A2 | 2003-07-03 | |||
| WO2002059576A1 | 2002-08-01 |
Foreign References:
| JP2004184217A | 2004-07-02 | |||
| JPH0882588A | 1996-03-26 | |||
| JP2004077305A | 2004-03-11 |
Attorney, Agent or Firm:
Iida, Toshizo (1-10 Shimbashi 3-chom, Minato-ku Tokyo, JP)
Download PDF: