Title:
SPECIMEN INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2016/153138
Kind Code:
A1
Abstract:
A specimen inspection apparatus into which a specimen transporting apparatus is inserted, the specimen inspection apparatus including: a platform including an upper plate and a lower plate disposed to face each other and to be spaced apart from each other by a predetermined distance; an injection part provided in the upper plate, a front end of the specimen transporting apparatus being inserted into the injection part; an introduction part connected to the injection part and provided between the upper and lower plate; and a plurality of stepped parts provided in the introduction part.
Inventors:
LEE YOUNG-GOUN (KR)
MIN JUNG-KI (KR)
LEE JONG-GUN (KR)
JUNG HYUN-JU (KR)
MIN JUNG-KI (KR)
LEE JONG-GUN (KR)
JUNG HYUN-JU (KR)
Application Number:
PCT/KR2015/010966
Publication Date:
September 29, 2016
Filing Date:
October 16, 2015
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
B01L3/02
Domestic Patent References:
| WO2014078100A1 | 2014-05-22 |
Foreign References:
| US8609038B2 | 2013-12-17 | |||
| US20040232074A1 | 2004-11-25 | |||
| US8623296B2 | 2014-01-07 | |||
| US8685340B2 | 2014-04-01 |
Other References:
See also references of EP 3274095A4
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
Download PDF: