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Title:
SPECIMEN SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2023/157353
Kind Code:
A1
Abstract:
This specimen support comprises: a substrate comprising a first surface, a second surface on the reverse side to the first surface, and a porous structure opening onto at least the first surface; a protective layer provided so as to cover the surface of the porous structure; and a conductive layer provided so as to cover at least the portion of the protective layer that is provided above the first surface.

Inventors:
IKEDA TAKAMASA (JP)
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
Application Number:
PCT/JP2022/033329
Publication Date:
August 24, 2023
Filing Date:
September 05, 2022
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N27/62; H01J49/04; H01J49/16
Domestic Patent References:
WO2019155741A12019-08-15
Foreign References:
JP2021124344A2021-08-30
US20110123411A12011-05-26
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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