Title:
STATE OF CHARGE ESTIMATION METHOD FOR SECONDARY BATTERY, STATE OF CHARGE ESTIMATION SYSTEM FOR SECONDARY BATTERY, AND ABNORMALITY DETECTION METHOD FOR SECONDARY BATTERY
Document Type and Number:
WIPO Patent Application WO/2020/201893
Kind Code:
A1
Abstract:
Provided is a state of charge (SOC) estimation method for a secondary battery, the method realizing highly precise estimation even if the deterioration of the secondary battery is advanced. Also provided is a capacity measurement system for a secondary battery, the system achieving highly precise estimation of SOC that can be performed in a short time and at a low cost. If the capacity of a second battery can be estimated with high precision, abnormal detection can be performed on the basis of that estimated value. Further provided is a novel abnormality detection method for a secondary battery. In a CCCV charging method, CC time and CV time are used as learning parameters for constructing a learning model. If this learning model is used, a highly precise estimated-capacity can be obtained by using, as the minimum input data, two parameters which are CC time and CV time, or three parameters which are CC time, CV time and a charge initiation voltage.
Inventors:
CHIDA AKIHIRO (JP)
MIKAMI MAYUMI (JP)
MIKAMI MAYUMI (JP)
Application Number:
PCT/IB2020/052666
Publication Date:
October 08, 2020
Filing Date:
March 23, 2020
Export Citation:
Assignee:
SEMICONDUCTOR ENERGY LAB (JP)
International Classes:
G01R31/36; H01M10/48; G01R31/3828; G01R31/388; H02J7/00; H02J7/02
Domestic Patent References:
| WO2016189832A1 | 2016-12-01 | |||
| WO2017221899A1 | 2017-12-28 |
Foreign References:
| US20160033582A1 | 2016-02-04 | |||
| JP2006226789A | 2006-08-31 | |||
| JP2014092431A | 2014-05-19 | |||
| JP2017090297A | 2017-05-25 | |||
| JP2002162451A | 2002-06-07 |
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