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Title:
STRAIN MEASUREMENT DEVICE AND STRAIN MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/229929
Kind Code:
A1
Abstract:
A strain measurement device according to an aspect of the present invention measures strain in a sample (1). A stress light-emitting body (2) is disposed at least in a predetermined region of a surface of the sample (1). The strain measurement device includes: a holder that supports the sample (1); a load applying mechanism that applies a load to the sample (1) as a result of moving the holder; a luminous marker (3) that is disposed at a surface of the holder; a light source that is configured so as to radiate excitation light onto the stress light-emitting body (2) and the marker (3); and a camera that is configured so as to acquire an image of light emitted from the stress light-emitting body (2) when the load is applied thereto and an image of light emitted from the marker (3).

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Inventors:
YOKOI YUSUKE (JP)
Application Number:
PCT/JP2021/012814
Publication Date:
November 18, 2021
Filing Date:
March 26, 2021
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01L1/00; G01N3/06
Foreign References:
JP2020034466A2020-03-05
JP2018163083A2018-10-18
JP2017129530A2017-07-27
JPS5923649U1984-02-14
US20150103333A12015-04-16
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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