Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
STRESS INFERENCE DEVICE, INFERENCE METHOD, PROGRAM, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/038776
Kind Code:
A1
Abstract:
A stress inference device (100X) mainly comprises a biological signal acquisition means (101X), a biological signal feature amount calculation means (103X), an attribute/pattern data acquisition means (104X), an attribute/pattern common feature amount selection means (105X), and a stress inference means (106X). The biological signal acquisition means (101X) acquires a biological signal of a measurement subject. The biological signal feature amount calculation means (103X) calculates biological signal feature amounts that are feature amounts of a biological signal related to stress. The attribute/pattern data acquisition means (104X) acquires attribute/pattern data that indicates an attribute and/or a pattern of the measurement subject. The attribute/pattern common feature amount selection means (105X) selects, from the biological signal feature amounts, an attribute/pattern common feature amount, which is a feature amount that does not depend on the attribute/pattern indicated by the attribute/pattern data. The stress inference means (106X) infers the stress of the measurement subject on the basis of the attribute/pattern common feature amount.

Inventors:
NAKASHIMA YOSHIKI (JP)
UMEMATSU TERUMI (JP)
TSUJIKAWA MASANORI (JP)
Application Number:
PCT/JP2020/031662
Publication Date:
February 24, 2022
Filing Date:
August 21, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NEC CORP (JP)
International Classes:
A61B5/16
Domestic Patent References:
WO2018221750A12018-12-06
WO2019159252A12019-08-22
Foreign References:
JP2012061222A2012-03-29
JP2018149262A2018-09-27
JPH04341243A1992-11-27
US20150265211A12015-09-24
Attorney, Agent or Firm:
NAKAMURA, Toshinobu et al. (JP)
Download PDF:



 
Previous Patent: ELEVATOR SYSTEM

Next Patent: WIDE-FIELD VIDEO DISPLAY DEVICE