Title:
STRUCTURE ABNORMALITY DETECTOR
Document Type and Number:
WIPO Patent Application WO/2018/207526
Kind Code:
A1
Abstract:
This structure abnormality detector comprises an imaging device and an evaluation processing device. The imaging device senses the presence of gas by imaging changes in incident light from a structure due to light absorption of gas that is present in a space. The evaluation processing device uses design information for the structure regarding sites where sight lines of the imaging device for gas detection locations on an imaging screen intersect with the structure, evaluates the possibility that a gas leak source is present in a site, and outputs site information for the structure on the basis of the evaluation results.
Inventors:
MORIMOTO TAKASHI (JP)
ASANO MOTOHIRO (JP)
TSUZUKI SEIICHI (JP)
SUZUKI HIROAKI (JP)
HIOKI TERUO (JP)
HOTTA HIDEAKI (JP)
TOKI AKIFUMI (JP)
ASANO MOTOHIRO (JP)
TSUZUKI SEIICHI (JP)
SUZUKI HIROAKI (JP)
HIOKI TERUO (JP)
HOTTA HIDEAKI (JP)
TOKI AKIFUMI (JP)
Application Number:
PCT/JP2018/014952
Publication Date:
November 15, 2018
Filing Date:
April 09, 2018
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
CHIYODA CORP (JP)
CHIYODA CORP (JP)
International Classes:
G01N21/17; G01M3/38; G01N21/27; G01N21/3504
Domestic Patent References:
| WO2016181854A1 | 2016-11-17 | |||
| WO2017022556A1 | 2017-02-09 | |||
| WO2016133049A1 | 2016-08-25 | |||
| WO2017061351A1 | 2017-04-13 | |||
| WO2017086230A1 | 2017-05-26 | |||
| WO2018038149A1 | 2018-03-01 |
Foreign References:
| JP2006518464A | 2006-08-10 | |||
| JP2015203412A | 2015-11-16 | |||
| JP2015204744A | 2015-11-16 | |||
| JP2009042965A | 2009-02-26 | |||
| JP2012022668A | 2012-02-02 | |||
| US20100127173A1 | 2010-05-27 |
Attorney, Agent or Firm:
SANO PATENT OFFICE (JP)
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