Title:
STRUCTURE PHOTOGRAPH EVALUATION METHOD, STRUCTURE PHOTOGRAPH EVALUATION DEVICE, IMAGING DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/228572
Kind Code:
A1
Abstract:
The present invention provides a structure photograph evaluation method, a structure photograph evaluation device, an imaging device, and a program that make it possible to evaluate the number of fields of view appropriately and efficiently in a structure photograph of a metal material. The structure photograph evaluation method comprises: an input step (S11) for acquiring a plurality of structure photographs taken at a prescribed imaging magnification for at least two or more fields of view of the metal material; a phase classification step (S12) for classifying phases in the plurality of structure photographs; a quantitative value calculation step (S13) for calculating quantitative values of the classified phases; a deviation calculation step (S14) for calculating deviation of the quantitative values; a visual field number pass/fail determination step (S15) for determining pass/fail for the number of fields of view of the plurality of structure photographs on the basis of the deviations; and an output step (S17) for outputting the pass/fail.
Inventors:
KIYOKANE NAOYA (JP)
ISHIKAWA SHIN (JP)
ISHIKAWA SHIN (JP)
Application Number:
PCT/JP2023/013410
Publication Date:
November 30, 2023
Filing Date:
March 30, 2023
Export Citation:
Assignee:
JFE STEEL CORP (JP)
International Classes:
G01N33/20; G01N1/28
Domestic Patent References:
| WO2022059186A1 | 2022-03-24 |
Foreign References:
| JP2009287941A | 2009-12-10 | |||
| JP2019012037A | 2019-01-24 |
Attorney, Agent or Firm:
SUGIMURA Kenji (JP)
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