[0001] This application claims the benefit of priority under 35 U.S.C. § 119 of Korean Patent Application Serial No. 10-2017-0050020, filed on April 18, 2017, the content of which is relied upon and incorporated herein by reference in its entirety.

FIELD

[0002] The present disclosure relates to a substrate edge test apparatus, system, and method, and more particularly, to a substrate edge test apparatus, system, and method for testing a substrate for defects existing in an edge portion thereof.

BACKGROUND

[0003] A glass substrate used in flat panel displays such as thin film transistor-liquid crystal displays (TFT-LCDs), plasma display panels (PDPs), electroluminescent (EL) displays, etc. is manufactured through a forming process. During the forming process, glass that is melted in a glass melting furnace is formed into a flat plate, the glass is cut according to a predetermined standard in a cutting process, and then, the cut glass is moved to a processing station to be further processed. At the processing station, the glass substrate can be cut according to a standard for flat panel displays, and a chamfering process for chamfering four edges of the glass substrate can be performed. In addition, after the chamfering process, a test can be performed to check whether defects such as chips or cracks have occurred in the edges chamfered through the chamfering process.

SUMMARY

[0004] One or more embodiments of the present disclosure provide an apparatus for testing an edge portion of a substrate, the apparatus including: a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross- section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.

[0005] One or more embodiments of the present disclosure provide a system for testing an edge portion of a substrate, the system including: a first photographing portion configured to generate a first image by photographing an end portion of the edge portion of the substrate; a second photographing portion configured to generate a second image by photographing a lower portion of the edge portion; a third photographing portion configured to generate a third image by photographing an upper portion of the edge portion; first to third illumination sources sequentially, respectively corresponding to the first to third photographing portions and configured to provide light with uniform illuminance; and a test data analysis unit configured to collect the first to third images, wherein the second illumination source is half C-shaped and includes a second curved surface facing the lower portion of the edge portion, and the third illumination source is half C-shaped and includes a third curved surface facing the upper portion of the edge portion.

[0006] One or more embodiments of the present disclosure provide a substrate edge test method including: generating a first image by irradiating light with uniform illuminance to an end portion of the edge portion of a substrate and photographing the end portion by using a first photographing portion, wherein the edge portion of the substrate is chamfered;

generating a second image by irradiating light with uniform illuminance to a lower portion of the edge portion and photographing the lower portion by using a second photographing portion; generating a third image by irradiating light with uniform illuminance to an upper portion of the edge portion and photographing the upper portion by using a third

photographing portion; and evaluating quality of the edge portion of the substrate based on the first image to the third images, wherein the evaluating of the quality of the edge portion in the substrate based on the first to third images comprises: summing up a first area comprising at least one area of defects within a set of first reference lines, wherein the first reference lines are predetermined reference lines on the first image; summing up a second area comprising at least one area of defects within a set of second reference lines, wherein the second reference lines are predetermined reference lines on the second image; summing up a third area comprising at least one area of chipping defects within a set of third reference lines, wherein the third reference lines are predetermined reference lines on the third image; and dividing a sum of the first to third areas by an area of the edge portion.

[0007] Additional features and advantages of the embodiments disclosed herein will be set forth in the detailed description which follows, and in part will be readily apparent to those skilled in the art from that description or recognized by practicing the disclosed embodiments as described herein, including the detailed description which follows, the claims, as well as the appended drawings.

[0008] It is to be understood that both the foregoing general description and the following detailed description present embodiments intended to provide an overview or framework for understanding the nature and character of the claimed embodiments. The accompanying drawings are included to provide further understanding, and are incorporated into and constitute a part of this specification. The drawings illustrate various embodiments of the disclosure, and together with the description serve to explain the principles and operations thereof.

DESCRIPTION OF THE DRAWINGS

[0009] FIG. 1 is a block diagram of a substrate edge test system according to exemplary embodiments;

[0010] FIG. 2 is a schematic diagram of chamfering equipment that may be included in the substrate edge test system according to exemplary embodiments;

[0011] FIG. 3 is a cross-sectional view illustrating an edge of a chamfered substrate according to exemplary embodiments;

[0012] FIGS. 4A to 4C are respectively a perspective view, a side view, and a layout of an optical system that may be included in a substrate edge test apparatus according to exemplary embodiments;

[0013] FIGS. 5A to 5C are cross-sectional views illustrating illumination sources that may be included in a substrate edge test apparatus according to exemplary embodiments; [0014] FIG. 6 is a schematic diagram illustrating an optical system that may be included in a substrate edge test apparatus according to exemplary embodiments;

[0015] FIG. 7 is a flowchart illustrating a substrate edge test method according to an exemplary embodiments;

[0016] FIG. 8 is a diagram of images of a substrate edge generated according to a substrate edge test method according to an exemplary embodiments; and

[0017] FIG. 9 is a graph for showing the effects of a substrate edge test apparatus, system, and method according to exemplary embodiments.

DETAILED DESCRIPTION

[0018] Hereinafter, exemplary embodiments of the present disclosure will be described in detail with reference to accompanying drawings. Like reference numerals denote the same elements on the drawings and repeated descriptions thereof are omitted.

[0019] FIG. 1 is a block diagram of a substrate edge test system 1000 according to exemplary embodiments.

[0020] Referring to FIG. 1, the substrate edge test system 1000 may include a test module 1030 and a test processor 1040.

[0021] According to exemplary embodiments, a substrate processing system 1010 may include a plurality of stations for producing a substrate 1. For example, the substrate processing system 1010 may include various processing stations such as a melt processing station, a shape processing station, a cut processing station, a chamfer processing station, a polish processing station, etc. However, the present disclosure is not limited thereto, and the substrate processing system 1010 may also include a cleanse processing station, a film accumulation processing station, a photolithography processing station, an etching processing station, a strip processing station, etc. The substrate processing system 1010 may produce the substrate 1 and provide the substrate 1 to a transport unit 1050.

[0022] A process controller 1020 may control the substrate processing system 1010. The process controller 1020 may be a computing device such as a work station computer, a desk top computer, a laptop computer, a tablet computer, etc. The process controller 1020 may store software for performing various functions such as receiving feedback with respect to processes, receiving test data, adjusting processes, etc.

[0023] According to exemplary embodiments, the substrate 1 may be a glass substrate. In this case, the substrate 1 may be used for manufacturing a flat panel display such as a thin film transistor-liquid crystal display (TFT-LCD), a plasma display panel (PDP), an electroluminescent (EL) display, etc.

[0024] The transport unit 1050 may be a transport system that may transport the substrate 1 produced by the substrate processing system 1010. The transport unit 1050 may include a conveyor system, etc. The transport unit 1050 may provide the substrate 1 to the test module 1030.

[0025] The test module 1030 may include one or more test stations capable of performing various tests with respect to the substrate 1. The substrate 1 may be loaded onto each of the test stations. According to the example embodiments, the test module 1030 may perform a test for checking whether the substrate 1 includes defects.

[0026] The test module 1030 may include a substrate edge test apparatus. The test module 1030 may check for defects that may have occurred during the chamfering process, e.g. , non-chamfering, over-chamfering, burning, chipping, cracking, etc. The test module 1030 may check for defects in the substrate edge, an upper surface, and/or a lower surface of the substrate.

[0027] The test processor 1040 may include a test data analysis unit 1041 analyzing test data transmitted from the test module 1030 and a test controller 1045 controlling the test module.

[0028] According to exemplary embodiments, a test data analysis unit 1041 may compare a degree of defect occurrence with a reference value or threshold values based on the test data. According to the example embodiments, this comparison may be performed through a look-up function with respect to data stored in the substrate edge test system 1000 and/or comparison with off-line data. The test data analysis unit 1041 may collect data from first to third photographing portions 200a, 200b, and 200c, which will be described later (see FIG. 4), so as to generate first to third images El , E2, and E3 (see FIG. 8) that are respectively images of an end portion l a (see FIG. 3), a lower portion lb (see FIG. 3), and an upper portion l c (see FIG. 3) of the edge portion.

[0029] The test data analysis unit 1041 may provide analysis data (that is obtained by analyzing the test data) to the processing controller 1020. The processing controller 1020 may transmit a feedback signal to the substrate processing system 1010 based on the analysis data. Based on the feedback signal, the substrate processing system 1010 may adjust and/or select processes to be performed.

[0030] The feedback signal may influence various elements that are used in performing and/or selecting of the substrate treatment processes. For example, the test data analyzed by the test data analysis unit 1041 may be provided to the processing controller 1020. After that, based on the analysis data, the processing controller 1020 may adjust one or more processing elements and/or selection of a certain processing element from among a plurality of processing elements.

[0031] The test module 1030 may be controlled by the test controller 1045. According to exemplary embodiments, the test controller 1045 is shown to be adjacent to the test module 1030, but is not limited thereto. For example, the test controller 1045 may be a computing device including one or more software products capable of controlling operations of the test module 1030, for example, a work station computer, a desk top computer, a laptop computer, a tablet computer, etc.

[0032] The substrate edge test system 1000 may perform a test with respect to the substrate 1 having various sizes and usages. For example, the substrate edge test system 1000 may perform a test with respect to a glass substrate.

[0033] FIG. 2 is a schematic diagram of chamfering equipment that may be included in the substrate edge test system according to an example embodiment. FIG. 3 is a cross- sectional view illustrating an edge of a chamfered substrate according to exemplary embodiments.

[0034] Referring to FIGS. 2 and 3, the chamfering equipment may include a first stage 10, a second stage 20, and a third stage 30. A straight arrow denotes a moving direction of the substrate 1, and a curved arrow denotes a rotation of the substrate 1. The substrate 1 may be conveyed by the transport unit such as a conveyor.

[0035] The substrate 1 may be loaded on the first stage 10 by the transport unit. The substrate 1 may have edge portions 1 e respectively corresponding to edges or four sides of a rectangle. The substrate 1 may extend in a first direction (x direction) parallel to the upper surface of the substrate 1 and in a second direction (y direction) parallel to the upper surface and intersecting the first direction (x direction). The first direction (x direction) and the second direction (y direction) may be substantially perpendicular, but are not limited thereto. Two of the four edge portions l e may extend substantially parallel to the first direction (x direction). The other two edge portions l e of the four edge portions le may extend substantially in parallel in the second direction (y direction). Unless otherwise specified, definitions of the extending direction of the edge portion 1 e and the first and second directions (x direction, y direction), which are the extension directions of the substrate, are the same as those described above. The first stage 10 may include first chamfering wheels 1 1 and first polishing wheels 12. As the substrate 1 moves along with the first stage 10, the first chamfering wheels 11 may chamfer the edge portions l e of the substrate 1. In addition, the first polishing wheels 12 may polish the edge portions l e that have been chamfered, so as to reduce roughness generated during the chamfering process.

[0036] The chamfering process is a process of rounding the edge portions l e of the glass substrate in order to prevent the edge portions l e from being easily damaged by an external shock, etc. When the chamfering process is performed, as shown in FIG. 3 each of the edge portions l e of the substrate 1 includes the end portion l a, the lower portion lb, and the upper portion l c.

[0037] The lower portion lb and the upper portion l c of the edge portion l e can be changed in accordance with the arrangement of the substrate 1 relative to a space, for example, the arrangement of the substrate 1 relative to the ground surface. Specifically, when one of the first direction (x direction) and the second direction (x direction), which is the direction in which the substrate extends substantially, is substantially perpendicular to the ground surface, the lower portion lb and the upper portion l c may be disposed on the left and right sides, respectively, with respect to the end portion l a of the edge portion l e from the viewpoint of the observer standing perpendicular to the ground. On the other hand, as described in this specification, when the first direction (x direction) and the second direction (x direction), which are the directions in which the substrate extends substantially, are parallel to the ground surface, the lower portion lb of the edge portion l e and the upper portion lc may be arranged on the upper side and the lower side with respect to the end portion l a of the edge portion l e from the viewpoint of the observer standing perpendicular to the ground. Therefore, the terms "lower portion lb" and "upper portion l c" of the edge portion l e used hereinafter are only for convenience of description and do not limit the idea of the present invention in any sense. Further, in accordance with the general process of manufaturing the substrate 1 , the substrate 1 during processing includes an upper surface exposed to the processing environment and a lower surface in contact with a supporting structure included in a carrier, a conveyor, etc. Therefore, if a predetermined portion of the edge le adjacent to the lower surface of the substrate is defined as the lower portion lb and a predetermined portion of the edge le adjacent to the upper surface of the substrate 1 is defined as the upper portion lc, the definition of the lower portion lb and the upper portion lc of the edge portion le will obvious to those of ordinary skill in the art. However, the present invention is not limited thereto, and the lower portion lb and the upper portion lc of the edge portion le may be interchanged with each other when the substrate 1 is inverted during the process. In this case, the lower portion of the edge portion before the substrate is inverted can be the upper portion of the edge portion after the substrate is inverted, and the upper portion of the edge portion before the substrate is inverted can be the lower portion of the edge portion after the substrate is inverted. In order to simultaneously perform the chamfering and the polishing of two edge portions le facing each other, the first chamfering wheels 11 and the first polishing wheels 12 in the first stage 10 may be arranged in two rows spaced apart from each other in a direction perpendicular to the moving direction of the substrate 1. The first chamfering wheels 11 and the first polishing wheels 12 in a row may be in parallel with the moving direction of the substrate 1 and may chamfer and polish an adjacent edge portion le. At the same time, the first chamfering wheels 11 and the first polishing wheels 12 in the other row may chamfer and polish another edge portion le facing the above edge portion le. Accordingly, two facing edge portions le of the substrate 1 may be simultaneously chamfered and polished on the first stage 10. The first chamfering wheels 11 may be closer to an inlet of the first stage 10 than the first polishing wheels 12 so that the substrate 1 may be firstly chamfered and then polished. A distance between the first chamfering wheels 11 and the first polishing wheels 12 in a row and the first chamfering wheels 11 and the first polishing wheels 12 in the other row may vary depending on a size of the substrate 1 that is chamfered and polished. Referring to FIG. 2, the first stage 10 is shown to have four first chamfering wheels 11 and six first polishing wheels 12, but is not limited thereto.

[0038] The second stage 20 may rotate the substrate 1. The second stage 20 may, for example, rotate the substrate 1 by an angle of about 90°. Accordingly, the other pair of edge portions 1 e of the substrate 1 may be chamfered and polished.

[0039] The third stage 30 may include second chamfering wheels 31 and second polishing wheels 32. The edge portions le that have not been chamfered and polished on the first stage 10 may be chamfered and polished on the third stage 30. Like the first stage 10, the third stage 30 may include the second chamfering wheels 31 and the second polishing wheels 32 in two separate rows, so that two facing edge portions le may be simultaneously chamfered and polished. Referring to FIG. 2, the third stage 30 is shown to have four second chamfering wheels 31 and six second polishing wheels 32, but is not limited thereto.

[0040] If the substrate 1 is substantially rectangular, lengths of a pair of two facing edge portions l e and lengths of the other pair of two facing edge portions le may be different from each other. However, the example embodiments are not limited thereto, and if the substrate 1 has substantially a square shape, the lengths of the four edge portions 1 e may be substantially equal to one another.

[0041] FIG. 4 A is a perspective view of an optical system that may be included in a substrate edge test apparatus according to exemplary embodiments. FIG. 4B is a side view of an optical system that may be included in a substrate edge test apparatus according to exemplary embodiments. FIG. 4C is a layout showing relative arrangements of a first illumination source and the substrate. FIGS. 5 A to 5 C are cross-sectional views illustrating illumination sources that may be included in a substrate edge test apparatus according to exemplary embodiments.

[0042] Referring to FIGS. 3 to 5C, the substrate edge test apparatus may include first to third illumination sources 100a, 100b, and 100c and first to third photographing portions 200a, 200b, and 200c. The substrate edge test apparatus may further include a first reflection unit 151 and a plurality of second reflection units 152.

[0043] The first illumination source 100a may correspond to the first reflection unit 151 and the first photographing portion 200 a. The first illumination source 100a may irradiate light of uniform illuminance to the end portion 1 a of the edge portion 1 e. The first illumination source 100a may irradiate light of uniform illuminance to the entire edge portion le. The light irradiated from the first illumination source 100a is reflected by the end portion la of the edge portion le, and after that, may reach the first photographing portion 200a via the first reflection unit 151. The irradiation of light of uniform illuminance to the end portion la and / or the edge portion l e means that the energy per unit area of the light irradiated to the end portion l a and/or the edge portion le is substantially the same throughout the end portion la and/or the edge portion l e.

[0044] The second illumination source 100b may correspond to the plurality of second reflection units 152 and the second photographing portion 200b. The second illumination source 100b may irradiate light of uniform illuminance to the lower portion lb of the edge portion le. The light irradiated from the second illumination source 100b is reflected by the lower portion lb of the edge portion le, and after that, may reach the second photographing portion 200b via the plurality of second reflection units 152.

[0045] The third illumination source 100c may correspond to the third photographing portion 200c. The third illumination source 100c may irradiate light of uniform illuminance to the upper portion lc of the edge portion le. The light irradiated from the third illumination source 100c is reflected by the upper portion lc of the edge portion le, and then, may reach the third photographing portion 200c.

[0046] The first to third illumination sources 100a, 100b, and 100c may be spaced apart from one another and arranged in a predetermined direction. As will be described later, the substrate edge test apparatus can inspect the edge portion le of the substrate 1 while proceeding in a predetermined direction. The first to third illumination sources 100a, 100b, and 100c may be spaced apart from one another and arranged in a direction substantially parallel to the proceeding direction of the substrate edge test apparatus. The extending direction of the edge portion of the substrate 1 loaded on the substrate edge test apparatus may be substantially parallel to the proceeding direction of the substrate edge test apparatus. The first to third illumination sources 100a, 100b, and 100c may be spaced apart from one another and arranged in an extending direction of the edge portion le after being loaded. The extending direction of the edge portion le of the substrate 1 may be the first direction (x direction) and / or the second direction (y direction) described with reference to Fig. 2.

[0047] The first to third photographing portions 200a, 200b, and 200c may be spaced apart from one another and arranged in a direction substantially parallel to the proceeding direction of the substrate edge test apparatus. The first to third illumination sources 100a, 100b, and 100c may be spaced apart from one another and arranged in an extending direction of the edge portion le after loaded. In exemplary embodiments, the substrate edge test apparatus may test the end portion la, the lower portion lb, and the upper portion lc of the edge portion le at the same time. The first to third illumination sources 100a, 100b, and 100c and the first to third photographing portions 200a, 200b, and 200c may capture images of the edge portion le while proceeding from an end portion to the other portion in the extending direction of the edge portion 1 e. [0048] As shown in FIG. 5A, the first illumination source 100a may be C-shaped in cross-section and includes a first curved surface lOOar facing the end portion l a of the edge portion l e. A profile of the first curved surface l OOar may include a part of at least one of a circle, an oval, a parabola, or a hyperbola, but is not limited thereto. The first curved surface l OOar may have a profile that is similar to the edge portion l e. The first curved surface l OOar may have a profile that is substantially the same as the edge portion l e. The first illumination source 100a may include a plurality of first light sources 1 10a that are arranged in rows and columns along the first curved surface l OOar. The plurality of first light sources 110a may be evenly distributed along the first curved surface lOOar. The plurality of first light sources 1 10a may be arranged so that intervals between neighboring first light sources 1 10a along the first curved surface lOOar are substantially equal to each other. The first light sources 1 10a may include, for example, light emitting diode (LED) light sources, but are not limited thereto. The first light sources 110a may be arranged so that the light may be irradiated evenly throughout the entire edge portion of the substrate 1.

[0049] A first central angle Θ1 , which is a central angle of the first illumination source 100a, may be about 180° or greater, but is not limited thereto. The central angle denotes an angle between a straight line connecting an end point el of the first illumination source 100a adjacent to the substrate 1 to a center point and a straight line connecting another end point e2 of the first illumination source 100a adj acent to the substrate 1 to the center point. When the first central angle Θ1 is equal to or greater than about 180°, the light may be uniformly irradiated to the entire edge portion l e even in a case where an angle between the upper surface and/or the lower surface of the substrate and a tangent of the profile of the edge portion l e is equal to or greater than a predetermined angle. The first illumination source 100a may further include a light diffuser for irradiating the light of uniform illuminance.

[0050] Referring to FIG. 4C, the first illumination source 100a may be inclined towards the extending direction of the edge portion by a first angle Θ. Accordingly, the light irradiated from the first illumination source 100a is reflected by the end portion l a of the edge portion l e and the first reflection unit 151 , and reaches the first photographing portion 200a The first photographing portion 200a may generate a first image El (see FIG. 8), which is an image of the end portion l a of the edge portion l e, and transmit the first image El to the test data analysis unit 1041.

[0051] As shown in FIG. 5B, the second illumination source 100b may be a half C-shape in cross-section having a second curved surface l OObr facing the lower portion of the edge portion l e. As shown in FIG. 5C, the third illumination source 100c may be a half C-shape in cross-section having a third curved surface lOOcr facing the upper portion of the edge portion l e. Profiles of the second and third curved surfaces lOObr and l OOcr may respectively include a part of at least one of a circle, an oval, a parabola, and a hyperbola, but are not limited thereto. The second and third curved surfaces lOObr and l OOcr may have the profiles that are similar to a part of the edge portion l e. The second and third curved surfaces l OObr and l OOcr may have the profiles that are substantially equal to a part of the edge portion l e. That is, the profile of the second and third curved surfaces lOObr and lOOcr may be substantially the same as the profile of a part of the edge portion l e enlarged by a predetermined ratio. The profile of the second curved surface l OObr may include an enlarged profile of the lower portion lb of the edge portion l e. The third curved surface lOOcr profile may include an enlarged profile of the upper portion l c of the edge portion l e. The second and third illumination sources 100b and 100c may respectively include a plurality of second and third light sources 1 10b and 1 10c that are arranged in rows and/or columns along the second and third curved surfaces l OObr and l OOcr. The plurality of second and third light sources 110b and 110c may be evenly distributed respectively along the second and third curved surfaces l OObr and l OOcr. The second light sources 1 10b may be arranged so that intervals between the neighboring second light sources 1 10b along the second curved surface l OObr may be substantially equal to each other. The third light sources 1 10c may be arranged so that intervals between the neighboring third light sources 1 10c along the third curved surface l OOcr may be substantially equal to each other. The second and third light sources 1 10b and 1 10c may include, for example, LED light sources, but are not limited thereto. The second light sources 1 10b may be arranged so that second light Le2, that is, the light irradiated from the second light sources 110b, may be substantially focused onto a point of the lower portion lb of the edge portion l e. The third light sources 110c may be arranged so that third light Le3, that is, the light irradiated from the third light sources 1 10c, may be substantially focused onto a point of the upper portion l c of the edge portion l e. Although not shown in the drawings, the second and third illumination sources 100b and 100c may further respectively include a light diffuser.

[0052] The light irradiated from the second illumination source 100b may be reflected by the lower portion lb of the edge portion l e and the plurality of second reflection units 152 towards the second photographing portion 200b. The second photographing portion 200b may generate a second image E2 (see FIG. 8), which is an image of the lower portion lb of the edge portion l e, and transmit the second image E2 to the test data analysis unit 1041 , etc.

[0053] The light irradiated from the third illumination source 100c is reflected by the upper portion l c of the edge portion l e and reaches the third photographing portion 200c. The third photographing portion 200c generates a third image E3 (see FIG. 8), which is an image of the upper portion l c of the edge portion l e, and transmit the third image E3 to the test data analysis unit 1041 , etc.

[0054] If the second and third illumination sources having C-shapes in cross-section, not the half C-shape, are used, clarity of the image may decrease due to interference between the light transmitted through the upper surface or the lower surface of the substrate 1 and the light reflected by the edge portion le. In detail, if the second illumination source 100b having a C-shape is used to capture an image of the lower portion lb of the edge portion l e, the light transmitted through the upper surface of the substrate 1 , the upper surface not being chamfered, and the light reflected by the lower portion lb of the edge portion l e interfere with each other. Therefore, when the second illumination source is C-shaped, a clear image of the lower portion lb of the edge portion l e may not be obtained due to the interference between the transmitted light and the reflected light. In addition, if the third illumination source 100c having a C-shape in cross-section is used to capture an image of the upper portion l c of the edge portion le, the light transmitted through the lower surface of the substrate 1 , the lower surface not being chamfered, and the light reflected by the upper portion l c of the edge portion le interfere with each other. Therefore, when the third illumination source is C-shaped in cross-section, a clear image of the upper portion l c of the edge portion l e may not be obtained due to the interference between the transmitted light and the reflected light.

[0055] According to exemplary embodiments, the second illumination source 100b may cover the lower portion lb of the edge portion l e. The second illumination source 100b may irradiate light so that the irradiated light reaches the lower portion lb of the edge portion le but does not reach the upper portion l c of the edge portion l e. The second illumination source 100b may at least partially expose the upper portion l c of the edge portion l e. The second illumination source 100b may not cover the upper portion l c of the edge portion l e. The third illumination source 100c may cover the upper portion l c of the edge portion l e. The third illumination source 100c may irradiate light so that the irradiated light reaches the upper portion l c of the edge portion l e but does not reach the lower portion lb of the edge portion l e. The third illumination source 100c may at least partially expose the lower portion lb of the edge portion l e. The third illumination source 100c may not cover the lower portion lb of the edge portion l e. According to exemplary embodiments, as the second and third illumination sources 100b and 100c of half C-shaped, unlike the first illumination source 100a, are used, the second and third images E2 and E3 (see FIG. 8) may be obtained with high resolution.

[0056] A difference between optical paths to the first to third photographing portions 200a, 200b, and 200c may occur according to a location of the edge portion l e. Therefore, a depth of focus may be adjusted by taking into account optical paths from the first to third photographing portions 200a, 200b, and 200c to the end portion l a, the lower portion lb, and the upper portion l c of the edge portion l e.

[0057] In order to determine focal depths of the first to third photographing portions 200a, 200b, and 200c, distances to the edge portion l e having a round shape should be accurately measured. Therefore, the first to third photographing portions 200a, 200b, and 200c may include auto-focusing (AF) modules. The AF module of the first photographing portion 200a may perform focusing based on the end portion l a of the edge portion l e. The AF modules of the second and third photographing portions 200b and 200c may perform focusing respectively based on the lower surface and the upper surface of the substrate 1 adjacent to the edge portion l e.

[0058] Although not shown in the drawings, the substrate edge test apparatus may include a moving unit. The first to third illumination sources 100a, 100b, and 100c, and the first to third photographing portions 200a, 200b, and 200c, the first reflection unit 151, and the plurality of second reflection units 152 may be integrally coupled to the moving unit. Accordingly, the substrate edge test apparatus may simultaneously generate the first to third images El, E2, and E3 (see FIG. 8) while moving from an end to the other end of the edge portion l e.

[0059] The substrate edge test apparatus may further include an optical microscope and a fourth illumination source corresponding to the optical microscope. The fourth illumination source may include a point illumination source, a vertical illumination source, a transverse illumination, etc. , but is not limited thereto.

[0060] FIG. 6 is a schematic diagram illustrating an optical system that may be included in a substrate edge test apparatus according to exemplary embodiments. [0061] Referring to FIG. 6, the first to third photographing portions 200a, 200b, and 200c may directly receive sequentially the light reflected from the end portion 1 a, the lower portion lb, and the upper portion l c of the edge portion l e in the substrate. Accordingly, the first reflection unit 151 and the plurality of second reflection units 152 may be omitted.

[0062] FIG. 7 is a flowchart illustrating a substrate edge test method according to exemplary embodiments. FIG. 8 is a diagram of images of a substrate edge generated according to a substrate edge test method according to exemplary embodiments. FIG. 9 is a graph for showing effects of a substrate edge test apparatus, system, and method according to exemplary embodiments.

[0063] Referring back to FIGS. 1, 3, 4A, 4B, and 7 to 9, the substrate 1 may be loaded on the test module 1030 including the substrate edge test apparatus according to exemplary embodiments in operation P510.

[0064] In addition, in operation P520, the substrate edge test apparatus may test the edge portion l e of the substrate 1. As described above, the substrate edge test apparatus may successively capture images of the edge portion l e of the substrate 1 while moving from an end to the other end of the edge portion l e. The first to third photographing portions 200a, 200b, and 200c may be spaced apart a predetermined distance from one another along the extending direction of the edge portion l e, and thus, the first to third photographing portions 200a, 200b, and 200c may capture images of different parts in the edge portion l e at the same time point.

[0065] In addition, in operation P530, the test data analysis unit 1041 may generate the first image El including the image of the end portion l a of the edge portion l e. The second photographing portion 200b may generate the second image E2 including the image of the lower portion lb of the edge portion l e. The third photographing portion 200c may generate the third image E3 including the image of the upper portion l c of the edge portion l e. The first to third photographing portions 200a, 200b, and 200c may generate the first to third images El, E2, and E3 at the same time.

[0066] If necessary, the test data analysis unit may combine the first to third images El , E2, and E3. Since the first to third photographing portions 200a, 200b, and 200c may capture images of different parts in the edge portion l e at the same time point, the location difference is corrected to combine the first to third images El , E2, and E3. To correct this difference, the test data analysis unit 1041 may synchronize locations of starting points of the edge portion l e in the first to third images El, E2, and E3. That is, the first to third images El, E2, and E3 may be synchronized with one another so that a starting point of the end portion l a of the edge portion l e on the first image El, a starting point of the lower portion lb of the edge portion l e on the second image E2, and a starting point of the upper portion l c of the edge portion l e on the third image E3 may coincide with one another, in order to generate a whole image. The first to third images El , E2, and E3 may be moved in parallel with one another based on differences among the physical locations of the first to third photographing portions 200a, 200b, and 200c, and accordingly, a whole image may be generated. The test data analysis unit 1041 may remove overlapping portions of the first to third images from the whole image, so that the overlapping portions in the first to third images El , E2, and E3 may not overly reflected to the whole image.

[0067] In addition, in operation P540, the test data analysis unit 1041 may sum up areas where defects, such as chipping defects, etc., may occur. A portion where the chipping defect may occur may have illuminance or brightness different from those of a portion where the defect does not occur, due to the light dispersion or interference. The test data analysis unit 1041 may determine whether a defect, such as a chipping defect, exists based on the illuminance or brightness, and may calculate an area of the defect.

[0068] As described above, the first to third images El , E2, and E3 may have overlapping portions. In detail, the overlapping portions of the first image El and the second image E2 indicate that a certain location on the edge portion l e is shown in both the first image El and the second image E2.

[0069] In order to remove any error caused by the overlapping portions, the test data analysis unit 1041 may separately sum up the area of the defects, such as chipping defects, with respect to each of the end portion l a, the lower portion lb, and the upper portion l c of the edge portion l e. The test data analysis unit 1041 may sum up the areas of the defects included within first reference lines cl that are predetermined reference lines on the first image El . The test data analysis unit 1041 may sum up the areas of the defects included within second reference lines c2 that are predetermined reference lines on the second image E2. The test data analysis unit 1041 may sum up the areas of the defects included within third reference lines c3 that are predetermined reference lines on the third image E3.

[0070] As shown in FIG. 8, the first to third reference lines cl , c2, and c3 may be substantially in parallel with the extending direction of the edge portion l e. The first to third reference lines cl , c2, and c3 may be reference lines for partitioning the end portion l a, the lower portion lb, and the upper portion l c of the edge portion l e based on a shape of the edge portion 1 e manufactured according to desirable manufacturing processes. For example, the first reference lines cl may include a reference line for partitioning the end portion l a and the lower portion lb of the edge portion l e, and a reference line for partitioning the end portion l a and the upper portion lc of the edge portion l e. The second reference lines c2 may include a reference line for partitioning the lower portion lb of the edge portion l e and the lower surface of the substrate, and a reference line for partitioning the lower portion lb and the end portion 1 a of the edge portion 1 e. The third reference lines c3 may include a reference line for partitioning the upper portion l c of the edge portion l e and the upper surface of the substrate, and a reference line for partitioning the upper portion l c and the end portion l a of the edge portion le. One of the first reference lines cl and one of the second reference lines c2 may substantially correspond to a same point on the edge portion l e. One of the first reference lines cl and one of the third reference lines c3 may substantially correspond to a same point on the edge portion l e.

[0071] However, exemplary embodiments are not limited to the above examples, and the test data analysis unit 1041 may sum up the area of the chipping defect, etc., occurring on the edge portion l e based on the whole image generated in operation P530.

[0072] In addition, in operation P550, a proceeding degree of the test may be determined. If a part of the edge portion of the substrate 1 remains to be tested, the substrate 1 may be rotated to be continuously tested in operation P560. The substrate 1 may rotate by about 90°, but is not limited thereto. Unlike the above, when all of the edge portion of the substrate is tested, a BCD (Bevel Chip Density) index that will be described later may be calculated and the test may be finished in operation P570.

[0073] During a cutting process with respect to the chamfered surface of the glass substrate, defects, e.g. , non-chamfering, over-chamfering, burning, chipping, cracking, etc., may occur. In particular, the chipping defects that occur during the chamfering process may cause generation of fine particles. These fine particles may cause a defective gate in post- processes, and accordingly, the production yield and reliability of the process of

manufacturing the glass substrate may degrade.

[0074] The fine particles generated from the chipping in the edge portion could adhere to a surface of the edge portion. Since the fine particles are exposed through a chemical reaction in post-processes, there is no way for checking for chipping defects in the edge portion according to the related art. As an index indicating defects such as chipping defects in the edge portion, a BCD index may be defined according to Equation 1 below.

[0075] BCD = ^ ^{ea of} !"" ^{g dgfect} (1)

area oteags porsoa

[0076] That is, the BCD index is an index for measuring the occurrence of defects by measuring a ratio of an area having chipping defects with respect to a total area.

[0077] Accordingly, the test data analysis unit 1041 may separately calculate the BCD index of each of the end portion la, the lower portion lb, and the upper portion lc of the edge portion le. For example, the test data analysis unit 1041 may calculate the BCD index of the end portion la of the edge portion le by dividing the sum of the area of the chipping defects on the first image El obtained in operation P540 by an area of the edge portion le disposed between the first reference lines cl on the first image El. The test data analysis unit 1041 may calculate the BCD index of the lower portion lb of the edge portion le by dividing the sum of the area of the chipping defects on the second image E2 obtained in operation P540 by an area of the edge portion le disposed between the second reference lines c2 on the second image E2. The test data analysis unit 1041 may calculate the BCD index of the upper portion lc of the edge portion le by dividing the sum of the area of the chipping defects on the third image E3 obtained in operation P540 by an area of the edge portion le disposed between the third reference lines c3 on the third image E3.

[0078] However, exemplary embodiments are not limited thereto, and the test data analysis unit 1041 may calculate a total BCD index by summing up the areas of the chipping defects on the first to third images El, E2, and E3 obtained in operation P540, and dividing the sum area by the area of the edge portion le. Alternatively, the test data analysis unit 1041 may calculate the total BCD index by dividing the sum of the total area of the chipping defects occurring on the edge portion le, the sum being calculated based on the whole image in operation P540, by the area of the edge portion le.

[0079] As shown in FIG. 9, the BCD index has a positive correlation with a ratio of generating the chipping defects. That is, the ratio of generating chipping defect increases as the BCD index increases. By measuring the BCD index from the image obtained by the substrate edge test apparatus according to exemplary embodiments, rapid feedback may be obtained, and accordingly, a production yield and quality of the manufacturing process may be improved.

[0080] While the present disclosure has been particularly shown and described with reference to exemplary embodiments described herein, it will be understood that various changes in form and details may be made therein without departing from the spirit and scope of the following claims.