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Patent Searching and Data


Title:
SUPPORT FOR ANALYSIS AND USE THEREOF
Document Type and Number:
WIPO Patent Application WO/2007/043393
Kind Code:
A1
Abstract:
Provided is a support for an analysis object which contains a conductive material having a nonmetal matrix. The support for analysis is useful as a result for cases where voltage application is required to the support for supplying or holding or analyzing the analysis object due to the conductive material contained in the conductive material. For instance, the support for analysis can be used in place of a metal sample plate for mass analysis such as MALDI-TOFMS or as a part thereof.

Inventors:
ANAHARA SEIJIRO (JP)
MORIYAMA AKIHIKO (JP)
Application Number:
PCT/JP2006/319774
Publication Date:
April 19, 2007
Filing Date:
October 03, 2006
Export Citation:
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Assignee:
BIOLOG CO LTD (JP)
IBIDEN CO LTD (JP)
ANAHARA SEIJIRO (JP)
MORIYAMA AKIHIKO (JP)
International Classes:
G01N27/62; G01N27/64
Foreign References:
JP2003043014A2003-02-13
JP2001013110A2001-01-19
JP2001515209A2001-09-18
JP2004184137A2004-07-02
Other References:
See also references of EP 1944603A4
Attorney, Agent or Firm:
ITEC INTERNATIONAL PATENT FIRM (9-26 Sakae 2-chome, Naka-ku, Nagoya-sh, Aichi 08, JP)
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