Title:
SURFACE DEFECT DATA ENHANCEMENT METHOD AND APPARATUS, AND ELECTRONIC DEVICE AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/082925
Kind Code:
A1
Abstract:
Provided in the present disclosure are a surface defect data enhancement method and apparatus, and an electronic device and a storage medium. The surface defect data enhancement method comprises: acquiring surface defect data to be enhanced; acquiring information about a part to be enhanced; dividing the surface defect data according to the information about the part to be enhanced; and performing data enhancement on the divided surface defect data. Surface defect data is divided according to information about a part to be enhanced, and data enhancement is then respectively performed on the divided surface defect data, such that data enhancement for a specific position is realized, thereby realizing surface defect detection for the specific position.
Inventors:
HU, Jianghong (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
CAO, Bin (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
CHEN, Liming (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
YAN, Wenzhong (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
TIAN, Kai (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
MA, Yuan (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
LI, Zhi (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
CAO, Bin (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
CHEN, Liming (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
YAN, Wenzhong (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
TIAN, Kai (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
MA, Yuan (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
LI, Zhi (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
Application Number:
PCT/CN2023/121002
Publication Date:
April 25, 2024
Filing Date:
September 25, 2023
Export Citation:
Assignee:
FITOW (TIANJIN) DETECTION TECHNOLOGY CO., LTD. (Lingshangjiayuan North Side of West Seventh Road, West Side of Central Avenue, Airport Logistics Processing Zone, , Tianjin Free Trade Test Zon, Binhai New Area Tianjin 8, CN)
International Classes:
G06T7/00; G06T5/00
Attorney, Agent or Firm:
CHOFN INTELLECTUAL PROPERTY (Floor 12 Left Bank Community No. 68 BeisihuanxiluHaidian District, Beijing 0, CN)
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