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Title:
SURFACE SHAPE MEASUREMENT DEVICE, MACHINE TOOL PROVIDED WITH SAME, AND SURFACE SHAPE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2015/122060
Kind Code:
A1
Abstract:
In this surface shape measurement device, through triangulation using a light beam (116), a displacement gauge (100) measures the displacement of the surface of an object being measured (130). In a first measurement, while consecutively measuring the object being measured (130) using the displacement gauge (100), a measurement control unit (156) scans the light beam (116) in a direction intersecting with an edge of the object being measured (130) by moving the displacement gauge (100) and object being measured (130) in relation to each other. In a second measurement, in a state in which the orientation of the displacement gauge (100) has been rotated 180 degrees from the orientation of the first measurement with the light beam (116) as the axis of rotational symmetry, the measurement control unit (156) consecutively measures the same positions as in the first measurement using the displacement gauge (100). An edge specification unit (160) specifies the edge position on the basis of the divergence start point at which the measurement values of the first measurement and second measurement start to diverge.

Inventors:
ONO KATSUHIKO (JP)
NISHIKAWA SHIZUO (JP)
Application Number:
PCT/JP2014/079052
Publication Date:
August 20, 2015
Filing Date:
October 31, 2014
Export Citation:
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Assignee:
DMG MORI SEIKI CO LTD (JP)
International Classes:
G01B11/24; B23Q17/24
Foreign References:
JPH10103915A1998-04-24
JP2011099729A2011-05-19
US20110290989A12011-12-01
JP2012194085A2012-10-11
JPH0222504A1990-01-25
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
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