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Patent Searching and Data


Title:
SYSTEM AND METHOD FOR MONITORING ABNORMAL STATE ON BASIS OF IMPACT EVENT
Document Type and Number:
WIPO Patent Application WO/2022/105285
Kind Code:
A1
Abstract:
Provided are a system and method for monitoring an abnormal state on the basis of a impact event, said system comprising: at least one monitoring terminal, used for real-time monitoring of the operational state of a target device to be monitored; each monitoring terminal comprises: at least one signal sensor, a sampling unit, a communication unit, and a control unit. An information processing server or the monitoring terminals are able to determine device feature data, environmental feature data, and/or input feature data, and, according to the device feature data, environmental feature data, and/or input feature data, determine whether an impact event associated with the target device has occurred; if it is determined that an impact event associated with the target device has occurred, then determining the point in time when the impact event occurred, and identifying the device feature data, environmental feature data, and/or input feature data to detect the abnormality information of the target device on the basis of the result of identification.

Inventors:
GUO CHUNLIN (CN)
GUO ERFU (CN)
Application Number:
PCT/CN2021/107896
Publication Date:
May 27, 2022
Filing Date:
July 22, 2021
Export Citation:
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Assignee:
UNIV NORTH CHINA ELECTRIC POWER (CN)
BEIJING DADI ZONGHENG TECH CO LTD (CN)
International Classes:
G06K9/00; G06N3/04
Foreign References:
CN106706294A2017-05-24
CN109507583A2019-03-22
CN112446309A2021-03-05
CN112649502A2021-04-13
CN111653291A2020-09-11
CN111322206A2020-06-23
CN111509841A2020-08-07
CN105021957A2015-11-04
US20110288799A12011-11-24
US20200041159A12020-02-06
Attorney, Agent or Firm:
ZHONGZI LAW OFFICE (CN)
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