Title:
SYSTEM AND METHOD FOR MULTIFRAME SURFACE MEASUREMENT OF THE SHAPE OF OBJECTS
Document Type and Number:
WIPO Patent Application WO/2009/035890
Kind Code:
A3
Abstract:
A system and method ate provided for the multiframe surface measurement of the shape of material objects. The system and method include capturing a plurality of images of portions of the surface of the object being measured and merging the captured images together in a common reference system, The shape and/or texture of a complex-shaped object can be measured using a 3D scanner by capturing multiple images from different perspectives and subsequently merging the images in a common coordinate system to align the merged images together. Alignment is achieved by capturing images of both a portion of the surface of the object and also of a reference object having known characteristics (e.g., shape and/ or texture). This allows the position and orientation of the object scanner to be determined in the coordinate system of the reference object.
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Inventors:
LAPA NIKOLAY L (RU)
Application Number:
PCT/US2008/075150
Publication Date:
August 12, 2010
Filing Date:
September 03, 2008
Export Citation:
Assignee:
ARTEC GROUP INC (US)
LAPA NIKOLAY L (RU)
LAPA NIKOLAY L (RU)
International Classes:
G01B11/24; G01B11/00
Foreign References:
| JP2006030127A | 2006-02-02 | |||
| JPH0996506A | 1997-04-08 | |||
| JP2001082941A | 2001-03-30 |
Other References:
See also references of EP 2195608A4
Attorney, Agent or Firm:
BLANCHE, Bradley, D. (LLP2450 Colorado Avenue,Suite 400, Santa Monica CA, US)
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