Title:
SYSTEM AND METHOD FOR STRESS PROFILING AND PERSONALIZED STRESS INTERVENTION RECOMMENDATION
Document Type and Number:
WIPO Patent Application WO/2024/053868
Kind Code:
A1
Abstract:
A method includes receiving stress-related measurements collected by one or more stress sensors, where the stress-related measurements represent one or more physiological responses of a user to a stressor. The method also includes receiving context data collected by one or more context sensors, where the context data represents a context associated with the user. The method further includes determining stress profile features associated with the user based on the stress-related measurements. The method also includes providing the stress profile features to a trained stress profile identification machine learning model to select a stress profile from among multiple candidate stress profiles for association with the user. The method further includes providing the selected stress profile and the context data to a trained stress intervention recommendation machine learning model to select a stress intervention activity for the user. In addition, the method includes recommending the selected stress intervention activity to the user.
Inventors:
NATHAN VISWAM (US)
RAHMAN MD MAHBUBUR (US)
KUANG JILONG (US)
GAO JUN (US)
RAHMAN MD MAHBUBUR (US)
KUANG JILONG (US)
GAO JUN (US)
Application Number:
PCT/KR2023/011063
Publication Date:
March 14, 2024
Filing Date:
July 28, 2023
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G16H20/70; A61B5/00; A61B5/16; G06N20/00; G16H10/60; G16H50/50; G16H50/70; H04W4/02
Foreign References:
| KR20210067827A | 2021-06-08 | |||
| KR20180126911A | 2018-11-28 | |||
| KR20220012066A | 2022-02-03 | |||
| US20170010658A1 | 2017-01-12 | |||
| US20150199010A1 | 2015-07-16 |
Attorney, Agent or Firm:
KIM, Tae-hun et al. (KR)
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