Title:
SYSTEM AND METHOD FOR SYNCHRONOUS MEASUREMENT OF TEMPERATURE AND DEFORMATION IN HIGH TEMPERATURE ENVIRONMENT
Document Type and Number:
WIPO Patent Application WO/2023/025068
Kind Code:
A1
Abstract:
The present disclosure relates to a system and method for synchronous measurement of temperature and deformation in a high temperature environment. The system comprises: a thermal assessment bin, used for performing thermal assessment on a tested piece placed in the thermal assessment bin; a temperature measurement device, used for measuring temperature information of a plurality of reference points on the surface of the tested piece; an image acquisition device, used for acquiring an image of the surface of the tested piece; and a processing device, used for extracting light intensity information of the plurality of reference points and a target point in the image; and obtaining intensity information of radiation light and reflected light of the plurality of reference points, and temperature information of the target point according to the light intensity information of the plurality of reference points and the target point, and the temperature information of the plurality of reference points and the target point so as to obtain a temperature field on the surface of the tested piece according to the temperature information of a plurality of target points. According to the present disclosure, the radiation light and the reflected light on the surface of the tested piece are separated, thereby obtaining high-precision temperature field information.
Inventors:
FENG XUE (CN)
WANG JINYANG (CN)
ZHANG JINSONG (CN)
YUE MENGKUN (CN)
TANG YUNLONG (CN)
WANG JINYANG (CN)
ZHANG JINSONG (CN)
YUE MENGKUN (CN)
TANG YUNLONG (CN)
Application Number:
PCT/CN2022/113719
Publication Date:
March 02, 2023
Filing Date:
August 19, 2022
Export Citation:
Assignee:
UNIV TSINGHUA (CN)
International Classes:
G01D21/02
Foreign References:
| CN113532548A | 2021-10-22 | |||
| CN112067147A | 2020-12-11 | |||
| CN112683338A | 2021-04-20 | |||
| CN113030174A | 2021-06-25 | |||
| CN111707382A | 2020-09-25 | |||
| CN111429540A | 2020-07-17 | |||
| CN111829896A | 2020-10-27 | |||
| JPH10123035A | 1998-05-15 |
Other References:
TANG YUNLONG; YUE MENGKUN; FANG XUFEI; FENG XUE: "Synchronous full-field measurement of temperature and deformation based on separated radiation and reflected light", OPTICS AND LASERS IN ENGINEERING, ELSEVIER, AMSTERDAM, NL, vol. 116, 1 January 1900 (1900-01-01), AMSTERDAM, NL , pages 94 - 102, XP085594889, ISSN: 0143-8166, DOI: 10.1016/j.optlaseng.2018.12.015
Attorney, Agent or Firm:
LINDA LIU & PARTNERS (CN)
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