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Patent Searching and Data


Title:
SYSTEMS AND METHODS FOR ESTIMATING PROPERTIES OF A SAMPLE
Document Type and Number:
WIPO Patent Application WO2004061419
Kind Code:
A3
Abstract:
Systems and methods for estimating properties of a sample are provided in which, for some embodiments, each datum of a set of data is modeled using a parameterized equation. The parameterized equation has multiple parameters, where each parameter represents a property of the subject. The parameterized equation is inverted, and the inverted parameterized equation provides an indication of one or more properties associated with the subject.

Inventors:
TWIEG DONALD BAKER (US)
Application Number:
PCT/US2003/041634
Publication Date:
April 28, 2005
Filing Date:
December 30, 2003
Export Citation:
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Assignee:
UAB RESEARCH FOUNDATION (US)
TWIEG DONALD BAKER (US)
International Classes:
G01R33/561; G01V3/00; G01R33/48; G01N; (IPC1-7): G01V3/00
Foreign References:
USRE32712E1988-07-12
US4307343A1981-12-22
US20030215154A12003-11-20
US5387865A1995-02-07
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