Title:
SYSTEMS AND METHODS FOR SURFACE NORMALS SENSING WITH POLARIZATION
Document Type and Number:
WIPO Patent Application WO/2021/071995
Kind Code:
A8
Abstract:
A method of performing surface profilometry includes receiving one or more polarization raw frames of a printed layer of a physical object undergoing additive manufacturing, the one or more polarization raw frames being captured at different polarizations by one or more polarization cameras, extracting one or more polarization feature maps in one or more polarization representation spaces from the one or more polarization raw frames, obtaining a coarse layer depth map of the printed layer, generating one or more surface-normal images based on the coarse layer depth map and the one or more polarization feature maps, and generating a 3D reconstruction of the printed layer based on the one or more surface-normal images.
Inventors:
KADAMBI ACHUTA (US)
VENKATARAMAN KARTIK (US)
RAO SUPREETH (US)
KALRA AGASTYA (US)
VENKATARAMAN KARTIK (US)
RAO SUPREETH (US)
KALRA AGASTYA (US)
Application Number:
PCT/US2020/054645
Publication Date:
May 05, 2022
Filing Date:
October 07, 2020
Export Citation:
Assignee:
BOSTON POLARIMETRICS INC (US)
International Classes:
G01B11/24
Attorney, Agent or Firm:
LEE, Shaun, P. (US)
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